Thomas Krieg

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Solms, DE

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Patents Grantslast 30 patents

Information Patent Grant
Apparatus for inspecting a disk-like object
- Patent number 7,489,394
- Issue date Feb 10, 2009
- Vistec Semiconductor Systems GmbH
- Joachim Wienecke
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for inspecting a semiconductor component
- Patent number 7,268,867
- Issue date Sep 11, 2007
- Vistec Semiconductor Systems GmbH
- Wolfgang Vollrath
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Apparatus for inspecting a disk-like object
- Publication number 20060245965
- Publication date Nov 2, 2006
- Vistec Semiconductor Systems GmbH
- Joachim Wienecke
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for inspecting a semiconductor component
- Publication number 20050219521
- Publication date Oct 6, 2005
- Leica Microsystems Semiconductor GmbH
- Wolfgang Vollrath
- G01 - MEASURING TESTING