Thomas LANGSCHWERT

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Kirchheim, DE

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Patents Grantslast 30 patents

Information Patent Grant
Methods and apparatuses for testing one or more reception paths in...
- Patent number 12,135,389
- Issue date Nov 5, 2024
- Infineon Technologies AG
- Alexander Onic
- G01 - MEASURING TESTING
Information Patent Grant
On-chip noise reduction and power consumption distribution for a ra...
- Patent number 11,531,085
- Issue date Dec 20, 2022
- Infineon Technologies AG
- Witold Gora
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatuses for testing one or more reception paths in...
- Patent number 11,269,055
- Issue date Mar 8, 2022
- Infineon Technologies AG
- Alexander Onic
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHODS AND APPARATUSES FOR TESTING ONE OR MORE RECEPTION PATHS IN...
- Publication number 20220113375
- Publication date Apr 14, 2022
- INFINEON TECHNOLOGIES AG
- Alexander ONIC
- G01 - MEASURING TESTING
Information Patent Application
ON-CHIP NOISE REDUCTION AND POWER CONSUMPTION DISTRIBUTION FOR A RA...
- Publication number 20200355791
- Publication date Nov 12, 2020
- INFINEON TECHNOLOGIES AG
- Witold GORA
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND APPARATUSES FOR TESTING ONE OR MORE RECEPTION PATHS IN...
- Publication number 20190271764
- Publication date Sep 5, 2019
- INFINEON TECHNOLOGIES AG
- Alexander ONIC
- G01 - MEASURING TESTING