Thomas M. Moore

Person

Dallas, TX, US

People

Patents Grantslast 30 patents

Information Patent Grant
Dynamic hierarchical reserved resource allocation
- Patent number 11,297,622
- Issue date Apr 5, 2022
- AT&T Intellectual Property I, L.P.
- Thomas Moore
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Coaxial fiber optical pyrometer with laser sample heater
- Patent number 11,169,029
- Issue date Nov 9, 2021
- Waviks, Inc.
- Gregory A. Magel
- G01 - MEASURING TESTING
Information Patent Grant
Service bandwidth provisioning on passive optical networks
- Patent number 11,088,905
- Issue date Aug 10, 2021
- AT&T Intellectual Property I, L.P.
- Thomas Moore
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Service bandwidth provisioning on passive optical networks
- Patent number 10,812,325
- Issue date Oct 20, 2020
- AT&T Intellectual Property I, L.P.
- Thomas Moore
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Method and apparatus for alignment of optical and charged-particle...
- Patent number 10,176,963
- Issue date Jan 8, 2019
- Waviks, Inc.
- Thomas M. Moore
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for stem sample inspection in a charged particle beam instru...
- Patent number RE46350
- Issue date Mar 28, 2017
- Omniprobe, Inc.
- Lyudmila Zaykova-Feldman
Information Patent Grant
Method for processing samples held by a nanomanipulator
- Patent number 8,759,765
- Issue date Jun 24, 2014
- Omniprobe, Inc.
- Cheryl D. Hartfield
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Apparatus for precursor delivery system for irradiation beam instru...
- Patent number 8,512,474
- Issue date Aug 20, 2013
- Omniprobe, Inc.
- Rocky Kruger
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Method and apparatus for acquiring simultaneous and overlapping opt...
- Patent number 8,440,969
- Issue date May 14, 2013
- Omniprobe, Inc.
- Thomas M. Moore
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for precursor delivery system for irradiation...
- Patent number 8,394,454
- Issue date Mar 12, 2013
- Omniprobe, Inc.
- Rocky Kruger
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Method for stem sample inspection in a charged particle beam instru...
- Patent number 8,247,768
- Issue date Aug 21, 2012
- Omniprobe, Inc.
- Lyudmila Zaykova-Feldman
- G01 - MEASURING TESTING
Information Patent Grant
Variable-tilt specimen holder and method and for monitoring milling...
- Patent number 8,227,781
- Issue date Jul 24, 2012
- Lyudmila Zaykova-Feldman
- G01 - MEASURING TESTING
Information Patent Grant
Method for stem sample inspection in a charged particle beam instru...
- Patent number 8,168,949
- Issue date May 1, 2012
- Omniprobe, Inc.
- Lyudmila Zaykova-Feldman
- G01 - MEASURING TESTING
Information Patent Grant
Single-channel optical processing system for energetic-beam microsc...
- Patent number 7,961,397
- Issue date Jun 14, 2011
- Omniprobe, Inc.
- Herschel M. Marchman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of forming TEM sample holder
- Patent number 7,935,937
- Issue date May 3, 2011
- Omniprobe, In.c
- Thomas M. Moore
- G01 - MEASURING TESTING
Information Patent Grant
Method for STEM sample inspection in a charged particle beam instru...
- Patent number 7,834,315
- Issue date Nov 16, 2010
- Omniprobe, Inc.
- Lyudmila Zaykova-Feldman
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for fibre channel distance extension embedded...
- Patent number 7,782,778
- Issue date Aug 24, 2010
- Samir Satish Sheth
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Method for automated stress testing of flip-chip packages
- Patent number 7,755,372
- Issue date Jul 13, 2010
- Omniprobe, Inc.
- Lyudmila Zaykova-Feldman
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for transfer of samples in a controlled enviro...
- Patent number 7,644,637
- Issue date Jan 12, 2010
- Omniprobe, Inc.
- Thomas M. Moore
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for automated stress testing of flip-chip pack...
- Patent number 7,446,542
- Issue date Nov 4, 2008
- Omniprobe, Inc.
- Lyudmila Zaykova-Feldman
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for the automated process of in-situ lift-out
- Patent number 7,414,252
- Issue date Aug 19, 2008
- Omniprobe, Inc.
- Thomas M. Moore
- G01 - MEASURING TESTING
Information Patent Grant
Strain detection for automated nano-manipulation
- Patent number 7,395,727
- Issue date Jul 8, 2008
- Omniprobe, Inc.
- Thomas M. Moore
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for in-situ probe tip replacement inside a cha...
- Patent number 7,381,971
- Issue date Jun 3, 2008
- Omniprobe, Inc.
- Thomas M. Moore
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of preparing a sample for examination in a TEM
- Patent number 7,315,023
- Issue date Jan 1, 2008
- Omniprobe, Inc.
- Thomas M. Moore
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method of detecting probe tip contact with a surface
- Patent number 7,208,724
- Issue date Apr 24, 2007
- Omniprobe, Inc.
- Thomas Moore
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Kit for preparing a tem sample holder
- Patent number 7,126,133
- Issue date Oct 24, 2006
- Omniprobe, Inc.
- Thomas M. Moore
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus for preparing a TEM sample holder
- Patent number 7,126,132
- Issue date Oct 24, 2006
- Omniprobe, Inc.
- Thomas M. Moore
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
TEM sample holder
- Patent number 7,115,882
- Issue date Oct 3, 2006
- Omniprobe, Inc.
- Thomas M. Moore
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for rapid sample preparation in a focused ion...
- Patent number 7,053,383
- Issue date May 30, 2006
- Omniprobe, Inc.
- Thomas M. Moore
- G01 - MEASURING TESTING
Information Patent Grant
Method for reworking metal layers on integrated circuit bond pads
- Patent number 6,821,791
- Issue date Nov 23, 2004
- Texas Instruments Incorporated
- Roger J. Stierman
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Dynamic Hierarchical Reserved Resource Allocation
- Publication number 20220225321
- Publication date Jul 14, 2022
- AT&T INTELLECTUAL PROPERTY I, L.P.
- Thomas Moore
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
SERVICE BANDWIDTH PROVISIONING ON PASSIVE OPTICAL NETWORKS
- Publication number 20200412609
- Publication date Dec 31, 2020
- AT&T INTELLECTUAL PROPERTY I, L.P.
- Thomas Moore
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
COAXIAL FIBER OPTICAL PYROMETER WITH LASER SAMPLE HEATER
- Publication number 20200064199
- Publication date Feb 27, 2020
- Waviks, Inc.
- Gregory A. Magel
- G02 - OPTICS
Information Patent Application
METHOD AND APPARATUS FOR ALIGNMENT OF OPTICAL AND CHARGED-PARTICLE...
- Publication number 20180166247
- Publication date Jun 14, 2018
- Waviks, Inc.
- Thomas M. Moore
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR PROCESSING SAMPLES HELD BY A NANOMANIPULATOR
- Publication number 20130037713
- Publication date Feb 14, 2013
- OMNIPROBE, INC.
- Cheryl D. Hartfield
- B82 - NANO-TECHNOLOGY
Information Patent Application
APPARATUS FOR PRECURSOR DELIVERY SYSTEM FOR IRRADIATION BEAM INSTRU...
- Publication number 20130025536
- Publication date Jan 31, 2013
- OMNIPROBE, INC.
- Rocky Kruger
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
METHOD AND APPARATUS FOR ACQUIRING SIMULTANEOUS AND OVERLAPPING OPT...
- Publication number 20120025075
- Publication date Feb 2, 2012
- OMNIPROBE, INC.
- Thomas M. Moore
- G02 - OPTICS
Information Patent Application
METHOD FOR STEM SAMPLE INSPECTION IN A CHARGED PARTICLE BEAM INSTRU...
- Publication number 20110031396
- Publication date Feb 10, 2011
- OMNIPROBE, INC.
- Lyudmila Zaykova-Feldman
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR STEM SAMPLE INSPECTION IN A CHARGED PARTICLE BEAM INSTRU...
- Publication number 20110031397
- Publication date Feb 10, 2011
- OMNIPROBE, INC.
- Lyudmila Zaykova-Feldman
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR THE MONITORING OF SAMPLE MILLING IN A CHAR...
- Publication number 20110017927
- Publication date Jan 27, 2011
- OMNIPROBE, INC.
- Lyudmila Zaykova-Feldman
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF ETCHING MATERIALS WITH ELECTRON BEAM AND LASER ENERGY
- Publication number 20100200546
- Publication date Aug 12, 2010
- OMNIPROBE, INC.
- Lyudmila Zaykova-Feldman
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHODS FOR ELECTRON-BEAM INDUCED DEPOSITION OF MATERIAL INSIDE ENE...
- Publication number 20100068408
- Publication date Mar 18, 2010
- OMNIPROBE, INC.
- Lyudmila Zaykova-Feldman
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
SINGLE-CHANNEL OPTICAL PROCESSING SYSTEM FOR ENERGETIC-BEAM MICROSC...
- Publication number 20100051802
- Publication date Mar 4, 2010
- OMNIPROBE, INC.
- Herschel M. Marchman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF FORMING TEM SAMPLE HOLDER
- Publication number 20090294690
- Publication date Dec 3, 2009
- OMNIPROBE, INC.
- Thomas M. Moore
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR PRECURSOR DELIVERY SYSTEM FOR IRRADIATION...
- Publication number 20090223451
- Publication date Sep 10, 2009
- OMNIPROBE, INC.
- Rocky Kruger
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
METHOD AND APPARATUS FOR TRANSFER OF SAMPLES IN A CONTROLLED ENVIRO...
- Publication number 20090078060
- Publication date Mar 26, 2009
- Thomas M. Moore
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Application
METHOD FOR AUTOMATED STRESS TESTING OF FLIP-CHIP PACKAGES
- Publication number 20090015274
- Publication date Jan 15, 2009
- OMNIPROBE, INC.
- Lyudmila Zaykova-Feldman
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR STEM SAMPLE INSPECTION IN A CHARGED PARTICLE BEAM INSTRU...
- Publication number 20080258056
- Publication date Oct 23, 2008
- OMNIPROBE, INC.
- Lyudmila Zaykova-Feldman
- G01 - MEASURING TESTING
Information Patent Application
Strain detection for automated nano-manipulation
- Publication number 20070089528
- Publication date Apr 26, 2007
- Thomas M. Moore
- G01 - MEASURING TESTING
Information Patent Application
TEM sample holder and method of forming same
- Publication number 20060219919
- Publication date Oct 5, 2006
- Thomas M. Moore
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for automated stress testing of flip-chip pack...
- Publication number 20060210140
- Publication date Sep 21, 2006
- Lyudmila Zaykova-Feldman
- G01 - MEASURING TESTING
Information Patent Application
Apparatus for preparing a TEM sample holder
- Publication number 20060113477
- Publication date Jun 1, 2006
- Thomas M. Moore
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TEM sample holder
- Publication number 20060113475
- Publication date Jun 1, 2006
- Thomas M. Moore
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of preparing a sample for examination in a TEM
- Publication number 20060113476
- Publication date Jun 1, 2006
- Thomas M. Moore
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Kit for preparing a TEM sample holder
- Publication number 20060113478
- Publication date Jun 1, 2006
- Thomas M. Moore
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Apparatus and method of detecting probe tip contact with a surface
- Publication number 20060091302
- Publication date May 4, 2006
- Thomas Moore
- B82 - NANO-TECHNOLOGY
Information Patent Application
Method and apparatus for the automated process of in-situ lift-out
- Publication number 20060091325
- Publication date May 4, 2006
- Thomas M. Moore
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for in-situ probe tip replacement inside a cha...
- Publication number 20060022135
- Publication date Feb 2, 2006
- Thomas M. Moore
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Multiple gas injection system for charged particle beam instruments
- Publication number 20060022136
- Publication date Feb 2, 2006
- Thomas M. Moore
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
METHOD AND APPARATUS FOR RAPID SAMPLE PREPARATION IN A FOCUSED ION...
- Publication number 20060016987
- Publication date Jan 26, 2006
- Thomas M. Moore
- G01 - MEASURING TESTING

Thomas M. Moore

Person

Patents Grantslast 30 patents

Dynamic hierarchical reserved resource allocation

Coaxial fiber optical pyrometer with laser sample heater

Service bandwidth provisioning on passive optical networks

Service bandwidth provisioning on passive optical networks

Method and apparatus for alignment of optical and charged-particle...

Method for stem sample inspection in a charged particle beam instru...

Method for processing samples held by a nanomanipulator

Apparatus for precursor delivery system for irradiation beam instru...

Method and apparatus for acquiring simultaneous and overlapping opt...

Method and apparatus for precursor delivery system for irradiation...

Method for stem sample inspection in a charged particle beam instru...

Variable-tilt specimen holder and method and for monitoring milling...

Method for stem sample inspection in a charged particle beam instru...

Single-channel optical processing system for energetic-beam microsc...

Method of forming TEM sample holder

Method for STEM sample inspection in a charged particle beam instru...

Apparatus and method for fibre channel distance extension embedded...

Method for automated stress testing of flip-chip packages

Method and apparatus for transfer of samples in a controlled enviro...

Apparatus and method for automated stress testing of flip-chip pack...

Method and apparatus for the automated process of in-situ lift-out

Strain detection for automated nano-manipulation

Method and apparatus for in-situ probe tip replacement inside a cha...

Method of preparing a sample for examination in a TEM

Apparatus and method of detecting probe tip contact with a surface

Kit for preparing a tem sample holder

Apparatus for preparing a TEM sample holder

TEM sample holder

Method and apparatus for rapid sample preparation in a focused ion...

Method for reworking metal layers on integrated circuit bond pads

Patents Applicationslast 30 patents

Dynamic Hierarchical Reserved Resource Allocation

SERVICE BANDWIDTH PROVISIONING ON PASSIVE OPTICAL NETWORKS

COAXIAL FIBER OPTICAL PYROMETER WITH LASER SAMPLE HEATER

METHOD AND APPARATUS FOR ALIGNMENT OF OPTICAL AND CHARGED-PARTICLE...

METHOD FOR PROCESSING SAMPLES HELD BY A NANOMANIPULATOR

APPARATUS FOR PRECURSOR DELIVERY SYSTEM FOR IRRADIATION BEAM INSTRU...

METHOD AND APPARATUS FOR ACQUIRING SIMULTANEOUS AND OVERLAPPING OPT...

METHOD FOR STEM SAMPLE INSPECTION IN A CHARGED PARTICLE BEAM INSTRU...

METHOD FOR STEM SAMPLE INSPECTION IN A CHARGED PARTICLE BEAM INSTRU...

METHOD AND APPARATUS FOR THE MONITORING OF SAMPLE MILLING IN A CHAR...

METHOD OF ETCHING MATERIALS WITH ELECTRON BEAM AND LASER ENERGY

METHODS FOR ELECTRON-BEAM INDUCED DEPOSITION OF MATERIAL INSIDE ENE...

SINGLE-CHANNEL OPTICAL PROCESSING SYSTEM FOR ENERGETIC-BEAM MICROSC...

METHOD OF FORMING TEM SAMPLE HOLDER

METHOD AND APPARATUS FOR PRECURSOR DELIVERY SYSTEM FOR IRRADIATION...

METHOD AND APPARATUS FOR TRANSFER OF SAMPLES IN A CONTROLLED ENVIRO...

METHOD FOR AUTOMATED STRESS TESTING OF FLIP-CHIP PACKAGES

METHOD FOR STEM SAMPLE INSPECTION IN A CHARGED PARTICLE BEAM INSTRU...

Strain detection for automated nano-manipulation

TEM sample holder and method of forming same

Apparatus and method for automated stress testing of flip-chip pack...

Apparatus for preparing a TEM sample holder

TEM sample holder

Method of preparing a sample for examination in a TEM

Kit for preparing a TEM sample holder

Apparatus and method of detecting probe tip contact with a surface

Method and apparatus for the automated process of in-situ lift-out

Method and apparatus for in-situ probe tip replacement inside a cha...

Multiple gas injection system for charged particle beam instruments

METHOD AND APPARATUS FOR RAPID SAMPLE PREPARATION IN A FOCUSED ION...