Thomas Nuytten

Follow

Person

Pellenberg, BE

People

Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for measuring a lateral depth in a microstructure
- Patent number 12,216,057
- Issue date Feb 4, 2025
- Imec VZW
- Thomas Nuytten
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for measuring the trap density in a 2-dimensional semiconduc...
- Patent number 11,898,958
- Issue date Feb 13, 2024
- Imec VZW
- Alessandra Leonhardt
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method and Apparatus for Measuring a Lateral Depth in a Microstructure
- Publication number 20220018781
- Publication date Jan 20, 2022
- IMEC vzw
- Thomas Nuytten
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR MEASURING THE TRAP DENSITY IN A 2-DIMENSIONAL SEMICONDUC...
- Publication number 20210356399
- Publication date Nov 18, 2021
- IMEC vzw
- Alessandra Leonhardt
- G01 - MEASURING TESTING