Thomas P. Dagostino

Person

Portland, OR, US

People

Patents Grantslast 30 patents

Information Patent Grant
Analog multi-channel probe system
- Patent number 5,418,470
- Issue date May 23, 1995
- Tektronix, Inc.
- Thomas P. Dagostino
- G01 - MEASURING TESTING
Information Patent Grant
Method for using a charge coupled device as a peak detector
- Patent number 4,562,363
- Issue date Dec 31, 1985
- Tektronix, Inc.
- Roydn Jones
- G01 - MEASURING TESTING
Information Patent Grant
Waveform storage and display system
- Patent number 4,510,571
- Issue date Apr 9, 1985
- Tektronix, Inc.
- Thomas P. Dagostino
- G01 - MEASURING TESTING
Information Patent Grant
Position control circuit for a digital oscilloscope
- Patent number 4,346,333
- Issue date Aug 24, 1982
- Tektronix, Inc.
- Thomas P. Dagostino
- G01 - MEASURING TESTING
Information Patent Grant
Waveform storage system
- Patent number 4,271,486
- Issue date Jun 2, 1981
- Tektronix, Inc.
- Thomas P. Dagostino
- G01 - MEASURING TESTING
Information Patent Grant
Display interpolator employing a transversal filter for a digital o...
- Patent number 4,263,593
- Issue date Apr 21, 1981
- Tektronix, Inc.
- Thomas P. Dagostino
- G01 - MEASURING TESTING
Information Patent Grant
Signal-envelope display system for a digital oscilloscope
- Patent number 4,251,815
- Issue date Feb 17, 1981
- Tektronix, Inc.
- Thomas P. Dagostino
- G01 - MEASURING TESTING
Information Patent Grant
Time dot display for a digital oscilloscope
- Patent number 4,251,814
- Issue date Feb 17, 1981
- Tektronix, Inc.
- Thomas P. Dagostino
- G01 - MEASURING TESTING
Information Patent Grant
Digital oscilloscope with reduced jitter due to sample uncertainty
- Patent number 4,251,754
- Issue date Feb 17, 1981
- Tektronix, Inc.
- Luis J. Navarro
- G01 - MEASURING TESTING
Information Patent Grant
Multiple waveform storage system
- Patent number 4,198,683
- Issue date Apr 15, 1980
- Tektronix, Inc.
- Thomas P. Dagostino
- G01 - MEASURING TESTING

Thomas P. Dagostino

Person

Patents Grantslast 30 patents

Analog multi-channel probe system

Method for using a charge coupled device as a peak detector

Waveform storage and display system

Position control circuit for a digital oscilloscope

Waveform storage system

Display interpolator employing a transversal filter for a digital o...

Signal-envelope display system for a digital oscilloscope

Time dot display for a digital oscilloscope

Digital oscilloscope with reduced jitter due to sample uncertainty

Multiple waveform storage system