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Thomas PFEIFER
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Zschopau, DE
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Patents Grants
last 30 patents
Information
Patent Grant
Sample transfer device
Patent number
10,551,285
Issue date
Feb 4, 2020
Leica Mikrosysteme GmbH
Leander Gaechter
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus for cooling samples during ion beam preparation
Patent number
8,648,316
Issue date
Feb 11, 2014
Leica Mikrosysteme GmbH
Thomas Pfeifer
G01 - MEASURING TESTING
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Patent Grant
Apparatus and method for sample preparation
Patent number
8,471,223
Issue date
Jun 25, 2013
Leica Mikrosysteme GmbH
Thomas Pfeifer
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
SAMPLE TRANSFER DEVICE
Publication number
20170370814
Publication date
Dec 28, 2017
Leica Mikrosysteme GmbH
Leander GAECHTER
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS AND METHOD FOR SAMPLE PREPARATION
Publication number
20120199552
Publication date
Aug 9, 2012
Leica Mikrosysteme GmbH
Thomas PFEIFER
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS FOR COOLING SAMPLES DURING ION BEAM PREPARATION
Publication number
20120160471
Publication date
Jun 28, 2012
Leica Mikrosysteme GmbH
Thomas PFEIFER
G01 - MEASURING TESTING