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Thomas Pompl
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Landshut, DE
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Patents Grants
last 30 patents
Information
Patent Grant
Electronic switching circuit, switching circuit test arrangement an...
Patent number
7,403,026
Issue date
Jul 22, 2008
Infineon Technologies AG
Martin Kerber
G01 - MEASURING TESTING
Information
Patent Grant
Method for fabricating a barrier layer
Patent number
6,730,607
Issue date
May 4, 2004
Infineon Technologies AG
Helmut Wurzer
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
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Patent Application
ENHANCED STATIC-DYNAMIC STRESS TECHNIQUES TO ACCELERATE LATENT DEFE...
Publication number
20240210466
Publication date
Jun 27, 2024
Intel Corporation
Andres MALDONADO
G01 - MEASURING TESTING
Information
Patent Application
Electronic switching circuit, switching circuit test arrangement an...
Publication number
20060282725
Publication date
Dec 14, 2006
Martin Kerber
G01 - MEASURING TESTING
Information
Patent Application
Method of producing an oxidation-protected electrode for a capaciti...
Publication number
20020068465
Publication date
Jun 6, 2002
Anke Krasemann
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method for fabricating a barrier layer
Publication number
20020055269
Publication date
May 9, 2002
Helmut Wurzer
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method for forming a dielectric on a semiconductor substrate
Publication number
20010046787
Publication date
Nov 29, 2001
Martin Kerber
H01 - BASIC ELECTRIC ELEMENTS