Thomas Schwager

Follow

Person

Berlin, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Method of processing an EDX/XRF map and a corresponding image proce...
- Patent number 12,073,535
- Issue date Aug 27, 2024
- Bruker Nano GmbH
- Thomas Schwager
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for improving an EBSD/TKD map
- Patent number 11,940,396
- Issue date Mar 26, 2024
- Bruker Nano GmbH
- Daniel Radu Goran
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for improving transmission Kikuchi diffraction pattern
- Patent number 11,270,867
- Issue date Mar 8, 2022
- Bruker Nano GmbH
- Thomas Schwager
- G01 - MEASURING TESTING
Information Patent Grant
Method and arrangement for identifying crystalline phases, a corres...
- Patent number 10,126,256
- Issue date Nov 13, 2018
- Bruker Nano GmbH
- Thomas Schwager
- G01 - MEASURING TESTING
Information Patent Grant
Method for identifying a crystallographic candidate phase of a crystal
- Patent number 9,279,779
- Issue date Mar 8, 2016
- Bruker Nano GmbH
- Thomas Schwager
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR IMPROVING AN EBSD/TKD MAP
- Publication number 20220221412
- Publication date Jul 14, 2022
- BRUKER NANO GMBH
- Daniel Radu GORAN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF PROCESSING AN EDX/XRF MAP AND A CORRESPONDING IMAGE PROCE...
- Publication number 20220198626
- Publication date Jun 23, 2022
- BRUKER NANO GMBH
- Thomas Schwager
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR IMPROVING TRANSMISSION KIKUCHI DIFFRACTION PATTERN
- Publication number 20210183612
- Publication date Jun 17, 2021
- BRUKER NANO GMBH
- Thomas Schwager
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND ARRANGEMENT FOR IDENTIFYING CRYSTALLINE PHASES, A CORRES...
- Publication number 20170167991
- Publication date Jun 15, 2017
- BRUKER NANO GMBH
- Thomas Schwager
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR IDENTIFYING A CRYSTALLOGRAPHIC CANDIDATE PHASE OF A CRYSTAL
- Publication number 20150233843
- Publication date Aug 20, 2015
- BRUKER NANO GMBH
- Thomas Schwager
- G01 - MEASURING TESTING