Thomas Steffen

Person

  • Eindhoven, NL

Patents Grantslast 30 patents

  • Information Patent Grant

    Optical analysis system

    • Patent number 7,405,825
    • Issue date Jul 29, 2008
    • Koninklijke Philiips Electronics N.V.
    • Frank Jeroen Pieter Schuurmans
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents