Thomas Struck

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Olching, DE

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Patents Grantslast 30 patents

Information Patent Grant
Method of measuring oscillatory semiconductor membranes and shieldi...
- Patent number 6,662,661
- Issue date Dec 16, 2003
- Leica Microsystems Semiconductor GmbH
- Gerd Stach
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
Method of measuring oscillatory semiconductor membranes and shieldi...
- Publication number 20020167666
- Publication date Nov 14, 2002
- Gerd Stach
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Method and device for analyzing structures of a photomask
- Publication number 20020001764
- Publication date Jan 3, 2002
- Guenther Ruhl
- G06 - COMPUTING CALCULATING COUNTING