Thomas T. Montoya

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Austin, TX, US

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Patents Grantslast 30 patents

Information Patent Grant
Process for testing a semiconductor device
- Patent number 6,433,571
- Issue date Aug 13, 2002
- Motorola, Inc.
- Thomas T. Montoya
- G01 - MEASURING TESTING
Information Patent Grant
Vacuum system and method for securing a semiconductor wafer in a pl...
- Patent number 6,290,274
- Issue date Sep 18, 2001
- TSK America, Inc.
- Thomas T. Montoya
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Grant
Spiral chuck
- Patent number 6,271,676
- Issue date Aug 7, 2001
- TSK America, Inc.
- Thomas T. Montoya
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Probe tip and a process for testing a semiconductor device
- Patent number 6,121,784
- Issue date Sep 19, 2000
- Thomas T. Montoya
- G01 - MEASURING TESTING
Information Patent Grant
Process for testing a semiconductor device
- Patent number 5,867,032
- Issue date Feb 2, 1999
- Motorola, Inc.
- Thomas T. Montoya
- G01 - MEASURING TESTING
Information Patent Grant
Method for probing a semiconductor wafer using a motor controlled s...
- Patent number 5,773,987
- Issue date Jun 30, 1998
- Motorola, Inc.
- Thomas T. Montoya
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for forming a test stack for semiconductor wafer probing...
- Patent number 5,656,943
- Issue date Aug 12, 1997
- Motorola, Inc.
- Thomas T. Montoya
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Bore probe card and method of testing
- Publication number 20030102878
- Publication date Jun 5, 2003
- Thomas T. Montoya
- G01 - MEASURING TESTING
Information Patent Application
PROBER INTERFACE PLATE
- Publication number 20010043073
- Publication date Nov 22, 2001
- THOMAS T. MONTOYA
- G01 - MEASURING TESTING