Thomas Traber

Follow

Person

Dublin, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Wafer chuck with integrated reference sample
- Patent number 6,952,258
- Issue date Oct 4, 2005
- Therma-Wave, Inc.
- Martin Ebert
- G01 - MEASURING TESTING
Information Patent Grant
Rotational stage with vertical axis adjustment
- Patent number 6,917,420
- Issue date Jul 12, 2005
- Therma-Wave, Inc.
- Thomas Traber
- G01 - MEASURING TESTING
Information Patent Grant
Rotational stage with vertical axis adjustment
- Patent number 6,771,372
- Issue date Aug 3, 2004
- Therma-Wave, Inc.
- Thomas Traber
- G01 - MEASURING TESTING
Information Patent Grant
Wafer chuck with integrated reference sample
- Patent number 6,757,059
- Issue date Jun 29, 2004
- Therma-Wave, Inc.
- Martin Ebert
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Rotational stage with vertical axis adjustment
- Publication number 20040223144
- Publication date Nov 11, 2004
- Thomas Traber
- G01 - MEASURING TESTING
Information Patent Application
Wafer chuck with integrated reference sample
- Publication number 20040207838
- Publication date Oct 21, 2004
- Martin Ebert
- G01 - MEASURING TESTING
Information Patent Application
Wafer chuck with integrated reference sample
- Publication number 20020159054
- Publication date Oct 31, 2002
- Martin Ebert
- G01 - MEASURING TESTING