Thomas Verburgt

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Eden Prairie, MN, US

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Patents Grantslast 30 patents

Information Patent Grant
Automated wafer defect inspection system and a process of performin...
- Patent number 9,464,992
- Issue date Oct 11, 2016
- Rudolph Technologies, Inc.
- Jeffrey L. O'Dell
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Automated wafer defect inspection system and a process of performin...
- Patent number 9,337,071
- Issue date May 10, 2016
- Rudolph Technologies, Inc.
- Jeffrey L. O'Dell
- G01 - MEASURING TESTING
Information Patent Grant
Automated wafer defect inspection system and a process of performin...
- Patent number 7,729,528
- Issue date Jun 1, 2010
- Rudolph Technologies, Inc.
- Jeffrey O'Dell
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Automated wafer defect inspection system and a process of performin...
- Patent number 6,937,753
- Issue date Aug 30, 2005
- August Technology Corp.
- Jeffrey O'Dell
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Automated wafer defect inspection system and a process of performin...
- Patent number 6,826,298
- Issue date Nov 30, 2004
- August Technology Corp.
- Jeffrey O'Dell
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Automated wafer defect inspection system and a process of performin...
- Patent number 6,324,298
- Issue date Nov 27, 2001
- August Technology Corp.
- Jeffrey O'Dell
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
Automated Wafer Defect Inspection System and a Process of Performin...
- Publication number 20160223470
- Publication date Aug 4, 2016
- Rudolph Technologies, Inc.
- Jeffrey L. O'Dell
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATED WAFER DEFECT INSPECTION SYSTEM AND A PROCESS OF PERFORMIN...
- Publication number 20120087569
- Publication date Apr 12, 2012
- Rudolph Technologies, Inc.
- Jeffrey O'Dell
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
AUTOMATED WAFER DEFECT INSPECTION SYSTEM AND A PROCESS OF PERFORMIN...
- Publication number 20100239157
- Publication date Sep 23, 2010
- Rudolph Technologies, Inc.
- Jeffrey O'Dell
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Automated wafer defect inspection system and a process of performin...
- Publication number 20050008218
- Publication date Jan 13, 2005
- Jeffrey O'Dell
- G06 - COMPUTING CALCULATING COUNTING