Thomas Vogels

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Pittsburgh, PA, US

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Patents Grantslast 30 patents

Information Patent Grant
System and method to test integrated circuits on a wafer
- Patent number 7,325,180
- Issue date Jan 29, 2008
- Carnegie Mellon University
- Lawrence Pileggi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM AND METHOD TO TEST INTEGRATED CIRCUITS ON A WAFER
- Publication number 20050138499
- Publication date Jun 23, 2005
- Lawrence Pileggi
- G01 - MEASURING TESTING