Thomas W. Bachelder

Follow

Person

Swanton, VT, US

People

Patents Grantslast 30 patents

Information Patent Grant
Segmented architecture for wafer test and burn-in
- Patent number 6,275,051
- Issue date Aug 14, 2001
- International Business Machines Corporation
- Thomas W. Bachelder
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Segmented architecture for wafer test & burn-in
- Publication number 20010050567
- Publication date Dec 13, 2001
- International Business Machines Corporation
- Thomas W. Bachelder
- G01 - MEASURING TESTING