Thomas Waas

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Munchen, DE

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Patents Grantslast 30 patents

Information Patent Grant
Vertex based layout pattern (VEP): a method and apparatus for descr...
- Patent number 6,892,367
- Issue date May 10, 2005
- PDF Solutions, Inc.
- Michal Palusinski
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of correcting physically-conditioned errors in measurement o...
- Patent number 6,795,574
- Issue date Sep 21, 2004
- Applied Integrated Systems & Software
- Hans Hartmann
- G01 - MEASURING TESTING
Information Patent Grant
Procedure for generating information for producing a pattern define...
- Patent number 6,107,207
- Issue date Aug 22, 2000
- Applied Integrated Systems & Software
- Thomas Waas
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
Vertex based layout pattern (VEP): a method and apparatus for descr...
- Publication number 20040003357
- Publication date Jan 1, 2004
- Michal Palusinski
- G06 - COMPUTING CALCULATING COUNTING