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Thomas Yun Fook Liew
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Singapore, SG
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last 30 patents
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Patent Grant
Method and apparatus for high throughput media defect testing using...
Patent number
6,366,081
Issue date
Apr 2, 2002
Data Storage Institute
Seng Ghee Tan
G01 - MEASURING TESTING
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Patent Grant
Defect analysis in magnetic thin films
Patent number
6,201,390
Issue date
Mar 13, 2001
Data Storage Institute
Jian-Ping Wang
G01 - MEASURING TESTING