Thomas Zelder

Person

Luneburg, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Method of determining scattering parameters using measurement arran...
- Patent number 9,470,713
- Issue date Oct 18, 2016
- Rosenberger Hochfrequenztechnik GmbH & Co. KG
- Thomas Zelder
- G01 - MEASURING TESTING
Information Patent Grant
Contactless measuring system for contactless decoupling of a signal...
- Patent number 9,291,644
- Issue date Mar 22, 2016
- Rosenberger Hochfrequenztechnik GmbH & Co. KG
- Thomas Zelder
- G01 - MEASURING TESTING
Information Patent Grant
Measuring system for determining scatter parameters
- Patent number 9,116,189
- Issue date Aug 25, 2015
- Rosenberger Hochfrequenztechnik GmbH & Co. KG
- Thomas Zelder
- G01 - MEASURING TESTING
Information Patent Grant
Contactless loop probe
- Patent number 8,963,570
- Issue date Feb 24, 2015
- Rosenberger Hochfrequenztechnik GmbH & Co. KG
- Thomas Zelder
- G01 - MEASURING TESTING
Information Patent Grant
Contactless measuring system for near field measurement of a signal...
- Patent number 8,803,538
- Issue date Aug 12, 2014
- Rosenberger Hochfrequenztechnik GmbH & Co. KG
- Thomas Zelder
- G01 - MEASURING TESTING
Information Patent Grant
Measurement arrangement having a calibration substrate and electron...
- Patent number 8,791,705
- Issue date Jul 29, 2014
- Rosenberger Hochfrequenztechnik GmbH & Co. KG
- Thomas Zelder
- G01 - MEASURING TESTING
Information Patent Grant
Measuring probe for a vector network analysis system
- Patent number 8,760,184
- Issue date Jun 24, 2014
- Rosenberger Hochfrequenztechnik GmbH & Co. KG
- Thomas Zelder
- G01 - MEASURING TESTING
Information Patent Grant
HF measurement system, method for the calibration thereof, and meth...
- Patent number 8,452,565
- Issue date May 28, 2013
- Rosenberger Hochfrequenztechnik GmbH & Co. KG
- Thomas Zelder
- G01 - MEASURING TESTING
Information Patent Grant
Loop-type directional coupler
- Patent number 8,121,574
- Issue date Feb 21, 2012
- Rosenberger Hochfrequenztechnik GmbH & Co. KG
- Thomas Zelder
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
CONTACTLESS MEASURING SYSTEM
- Publication number 20140300381
- Publication date Oct 9, 2014
- Thomas Zelder
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF DETERMINING SCATTERING PARAMETERS USING MEASUREMENT ARRAN...
- Publication number 20140300380
- Publication date Oct 9, 2014
- Thomas Zelder
- G01 - MEASURING TESTING
Information Patent Application
CONTACTLESS LOOP PROBE
- Publication number 20110267088
- Publication date Nov 3, 2011
- ROSENBERGER HOCHFREQUENZTECHNIK GMBH & CO. KG
- Thomas Zelder
- G01 - MEASURING TESTING
Information Patent Application
CONTACTLESS MEASURING SYSTEM
- Publication number 20110260743
- Publication date Oct 27, 2011
- ROSENBERGER HOCHFREQUENZTECHNIK GMBH & CO. KG
- Thomas Zelder
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT ARRANGEMENT HAVING A CALIBRATION SUBSTRATE AND ELECTRON...
- Publication number 20110254536
- Publication date Oct 20, 2011
- Rosenberger Hochfrequenztechnik GmbH & Co. KG
- Thomas Zelder
- G01 - MEASURING TESTING
Information Patent Application
MEASURING SYSTEM FOR DETERMINING SCATTER PARAMETERS
- Publication number 20110241712
- Publication date Oct 6, 2011
- ROSENBERGER HOCHFREQUENZTECHNIK GMBH & CO. KG
- Thomas Zelder
- G01 - MEASURING TESTING
Information Patent Application
MEASURING PROBE
- Publication number 20110163773
- Publication date Jul 7, 2011
- ROSENBERGER HOCHFREQUENZTECHNIK GMBH & CO. KG
- Thomas Zelder
- G01 - MEASURING TESTING
Information Patent Application
LOOP-TYPE DIRECTIONAL COUPLER
- Publication number 20100271150
- Publication date Oct 28, 2010
- ROSENBERGER HOCHFREQUENZTECHNIK GMBH & CO. KG
- Thomas Zelder
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HF MEASUREMENT SYSTEM, METHOD FOR THE CALIBRATION THEREOF, AND METH...
- Publication number 20090319217
- Publication date Dec 24, 2009
- Rosenberger Hochfrequenztechnik GmbH & Co. KG
- Thomas Zelder
- G01 - MEASURING TESTING

Thomas Zelder

Person

Patents Grantslast 30 patents

Method of determining scattering parameters using measurement arran...

Contactless measuring system for contactless decoupling of a signal...

Measuring system for determining scatter parameters

Contactless loop probe

Contactless measuring system for near field measurement of a signal...

Measurement arrangement having a calibration substrate and electron...

Measuring probe for a vector network analysis system

HF measurement system, method for the calibration thereof, and meth...

Loop-type directional coupler

Patents Applicationslast 30 patents

CONTACTLESS MEASURING SYSTEM

METHOD OF DETERMINING SCATTERING PARAMETERS USING MEASUREMENT ARRAN...

CONTACTLESS LOOP PROBE

CONTACTLESS MEASURING SYSTEM

MEASUREMENT ARRANGEMENT HAVING A CALIBRATION SUBSTRATE AND ELECTRON...

MEASURING SYSTEM FOR DETERMINING SCATTER PARAMETERS

MEASURING PROBE

LOOP-TYPE DIRECTIONAL COUPLER

HF MEASUREMENT SYSTEM, METHOD FOR THE CALIBRATION THEREOF, AND METH...