Thorsten BENTER

Person

Haan, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Ionization device and mass spectrometer
- Patent number 12,176,199
- Issue date Dec 24, 2024
- LEYBOLD GMBH
- Yessica Brachthaeuser
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer and method for analysing a gas by mass spectrometry
- Patent number 11,791,147
- Issue date Oct 17, 2023
- LEYBOLD GMBH
- Anthony Hin Yiu Chung
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ionization device with mass spectrometer therewith
- Patent number 10,236,169
- Issue date Mar 19, 2019
- Carl Zeiss SMT GmbH
- Michel Aliman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and device to increase the internal energy of ions in mass s...
- Patent number 9,324,548
- Issue date Apr 26, 2016
- Bruker Daltonik GmbH
- Thorsten Benter
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Chemical ionization with reactant ion formation at atmospheric pres...
- Patent number 9,228,926
- Issue date Jan 5, 2016
- Thorsten Benter
- G01 - MEASURING TESTING
Information Patent Grant
High yield atmospheric pressure ion source for ion spectrometers in...
- Patent number 8,481,927
- Issue date Jul 9, 2013
- Bruker Daltonik, GmbH
- Jochen Franzen
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC

Patents Applicationslast 30 patents

Information Patent Application
RESIDUAL GAS ANALYSER, AND EUV LITHOGRAPHY SYSTEM HAVING A RESIDUAL...
- Publication number 20230162967
- Publication date May 25, 2023
- Carl Zeiss SMT GMBH
- Achim SCHOELL
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HOLDING DEVICE FOR AT LEAST ONE FILAMENT AND MASS SPECTROMETER
- Publication number 20230084351
- Publication date Mar 16, 2023
- Leybold GmbH
- Niklas Pengemann
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IONIZATION DEVICE AND MASS SPECTROMETER
- Publication number 20220230865
- Publication date Jul 21, 2022
- Leybold GmbH
- Yessica Brachthaeuser
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETER AND METHOD FOR ANALYSING A GAS BY MASS SPECTROMETRY
- Publication number 20220005682
- Publication date Jan 6, 2022
- Leybold GmbH
- Anthony Hin Yiu Chung
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IONIZATION DEVICE WITH MASS SPECTROMETER THEREWITH
- Publication number 20170278690
- Publication date Sep 28, 2017
- Carl Zeiss SMT GMBH
- Michel Aliman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHEMICAL IONIZATION WITH REACTANT ION FORMATION AT ATMOSPHERIC PRES...
- Publication number 20140314660
- Publication date Oct 23, 2014
- Thorsten BENTER
- G01 - MEASURING TESTING
Information Patent Application
Method and Device for Mass Spectrometry Examination of Analytes
- Publication number 20080296485
- Publication date Dec 4, 2008
- Bruker Daltonik GmbH
- Thorsten Benter
- H01 - BASIC ELECTRIC ELEMENTS

Thorsten BENTER

Person

Patents Grantslast 30 patents

Ionization device and mass spectrometer

Mass spectrometer and method for analysing a gas by mass spectrometry

Ionization device with mass spectrometer therewith

Method and device to increase the internal energy of ions in mass s...

Chemical ionization with reactant ion formation at atmospheric pres...

High yield atmospheric pressure ion source for ion spectrometers in...

Patents Applicationslast 30 patents

RESIDUAL GAS ANALYSER, AND EUV LITHOGRAPHY SYSTEM HAVING A RESIDUAL...

HOLDING DEVICE FOR AT LEAST ONE FILAMENT AND MASS SPECTROMETER

IONIZATION DEVICE AND MASS SPECTROMETER

MASS SPECTROMETER AND METHOD FOR ANALYSING A GAS BY MASS SPECTROMETRY

IONIZATION DEVICE WITH MASS SPECTROMETER THEREWITH

CHEMICAL IONIZATION WITH REACTANT ION FORMATION AT ATMOSPHERIC PRES...

Method and Device for Mass Spectrometry Examination of Analytes