Thorsten Bucksch

Person

Munchen, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Neural network circuitry for motors with first plurality of neurons...
- Patent number 11,556,097
- Issue date Jan 17, 2023
- Infineon Technologies AG
- Frederik Funk
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Neural network circuitry for motors
- Patent number 11,456,646
- Issue date Sep 27, 2022
- Infineon Technologies AG
- Frederik Funk
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Non-volatile memory testing
- Patent number 10,438,680
- Issue date Oct 8, 2019
- Infineon Technologies AG
- Thorsten Bucksch
- G11 - INFORMATION STORAGE
Information Patent Grant
Semi-conductor component test device, in particular data buffer com...
- Patent number 7,421,629
- Issue date Sep 2, 2008
- Infineon Technologies AG
- Thorsten Bucksch
- G11 - INFORMATION STORAGE
Information Patent Grant
Semi-conductor component test device with shift register, and semi-...
- Patent number 7,415,649
- Issue date Aug 19, 2008
- Infineon Technologies AG
- Thorsten Bucksch
- G11 - INFORMATION STORAGE
Information Patent Grant
Device and a process for the calibration of a semiconductor compone...
- Patent number 7,375,508
- Issue date May 20, 2008
- Infineon Technologies AG
- Thorsten Bucksch
- G11 - INFORMATION STORAGE
Information Patent Grant
Inputting and outputting operating parameters for an integrated sem...
- Patent number 7,330,378
- Issue date Feb 12, 2008
- Infineon Technologies, AG
- Martin Perner
- G11 - INFORMATION STORAGE
Information Patent Grant
Contact plate for use in standardizing tester channels of a tester...
- Patent number 7,323,861
- Issue date Jan 29, 2008
- Infineon Technologies AG
- Thorsten Bucksch
- G01 - MEASURING TESTING
Information Patent Grant
Signal test procedure for testing semi-conductor components and a t...
- Patent number 7,317,323
- Issue date Jan 8, 2008
- Infineon Technologies AG
- Thorsten Bucksch
- G11 - INFORMATION STORAGE
Information Patent Grant
Semi-conductor component, as well as a process for the in-or output...
- Patent number 7,184,339
- Issue date Feb 27, 2007
- Infineon Technologies AG
- Thorsten Bucksch
- G11 - INFORMATION STORAGE
Information Patent Grant
Test device for wafer testing digital semiconductor circuits
- Patent number 7,180,313
- Issue date Feb 20, 2007
- Infineon Technologies AG
- Thorsten Bucksch
- G11 - INFORMATION STORAGE
Information Patent Grant
Calibration device for the calibration of a tester channel of a tes...
- Patent number 7,061,260
- Issue date Jun 13, 2006
- Infineon Technologies AG
- Gerd Frankowsky
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for calibrating a semiconductor test system
- Patent number 7,061,227
- Issue date Jun 13, 2006
- Infineon Technologies AG
- Thorsten Bucksch
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for testing a memory circuit
- Patent number 6,898,739
- Issue date May 24, 2005
- Infineon Technologies AG
- Thorsten Bucksch
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and device for testing set-up time and hold time of signals...
- Patent number 6,754,869
- Issue date Jun 22, 2004
- Infineon Technologies AG
- Thorsten Bucksch
- G11 - INFORMATION STORAGE
Information Patent Grant
Integrated test circuit
- Patent number 6,750,670
- Issue date Jun 15, 2004
- Infineon Technologies AG
- Thorsten Bucksch
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SHUNTLESS MOTOR CONTROL FOR DC MOTORS
- Publication number 20250211143
- Publication date Jun 26, 2025
- INFINEON TECHNOLOGIES AG
- Thorsten Bucksch
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
NEURAL NETWORK CIRCUITRY FOR MOTORS
- Publication number 20210359577
- Publication date Nov 18, 2021
- INFINEON TECHNOLOGIES AG
- Frederik Funk
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
NEURAL NETWORK CIRCUITRY FOR MOTORS WITH FIRST PLURALITY OF NEURONS...
- Publication number 20210356917
- Publication date Nov 18, 2021
- INFINEON TECHNOLOGIES AG
- Frederik Funk
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
NON-VOLATILE MEMORY TESTING
- Publication number 20180047458
- Publication date Feb 15, 2018
- INFINEON TECHNOLOGIES AG
- Thorsten Bucksch
- G11 - INFORMATION STORAGE
Information Patent Application
Semi-conductor component test device with shift register, and semi-...
- Publication number 20060253756
- Publication date Nov 9, 2006
- Infineon Technologies AG
- Thorsten Bucksch
- G11 - INFORMATION STORAGE
Information Patent Application
Semiconductor component test procedure, as well as a data buffer co...
- Publication number 20060156081
- Publication date Jul 13, 2006
- Infineon Technologies AG
- Thorsten Bucksch
- G11 - INFORMATION STORAGE
Information Patent Application
Memory buffer
- Publication number 20060126408
- Publication date Jun 15, 2006
- Infineon Technologies AG
- Thorsten Bucksch
- G11 - INFORMATION STORAGE
Information Patent Application
Inputting and outputting operating parameters for an integrated sem...
- Publication number 20060120139
- Publication date Jun 8, 2006
- Martin Perner
- G11 - INFORMATION STORAGE
Information Patent Application
Semi-conductor component test device, in particular data buffer com...
- Publication number 20060107155
- Publication date May 18, 2006
- Infineon Technologies AG
- Thorsten Bucksch
- G11 - INFORMATION STORAGE
Information Patent Application
Semi-conductor component, as well as a process for the in-or output...
- Publication number 20060087900
- Publication date Apr 27, 2006
- Infineon Technologies AG
- Thorsten Bucksch
- G11 - INFORMATION STORAGE
Information Patent Application
Device and a process for the calibration of a semiconductor compone...
- Publication number 20060005089
- Publication date Jan 5, 2006
- Infineon Technologies AG
- Thorsten Bucksch
- G01 - MEASURING TESTING
Information Patent Application
Semi-conductor component test procedure, in particular for a system...
- Publication number 20050273679
- Publication date Dec 8, 2005
- Infineon Technologies AG
- Thorsten Bucksch
- G11 - INFORMATION STORAGE
Information Patent Application
Semi-conductor component test procedure, as well as a data buffer c...
- Publication number 20050254324
- Publication date Nov 17, 2005
- Infineon Technologies AG
- Thorsten Bucksch
- G11 - INFORMATION STORAGE
Information Patent Application
Contact plate for use in standardizing tester channels of a tester...
- Publication number 20050200372
- Publication date Sep 15, 2005
- Thorsten Bucksch
- G01 - MEASURING TESTING
Information Patent Application
Test device for wafer testing digital semiconductor circuits
- Publication number 20050162176
- Publication date Jul 28, 2005
- Thorsten Bucksch
- G01 - MEASURING TESTING
Information Patent Application
Signal test procedure for testing semi-conductor components and a t...
- Publication number 20050093564
- Publication date May 5, 2005
- Infineon Technologies AG
- Thorsten Bucksch
- G01 - MEASURING TESTING
Information Patent Application
Calibration device for the calibration of a tester channel of a tes...
- Publication number 20050046436
- Publication date Mar 3, 2005
- Gerd Frankowsky
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for calibrating a semiconductor test system
- Publication number 20050024059
- Publication date Feb 3, 2005
- Infineon Technologies AG
- Thorsten Bucksch
- G01 - MEASURING TESTING
Information Patent Application
Integrated test circuit
- Publication number 20030107392
- Publication date Jun 12, 2003
- Thorsten Bucksch
- G01 - MEASURING TESTING
Information Patent Application
Method and device for testing a memory circuit
- Publication number 20020174386
- Publication date Nov 21, 2002
- Thorsten Bucksch
- G11 - INFORMATION STORAGE
Information Patent Application
Method and device for testing set-up time and hold time of signals...
- Publication number 20020008503
- Publication date Jan 24, 2002
- Thorsten Bucksch
- G11 - INFORMATION STORAGE

Thorsten Bucksch

Person

Patents Grantslast 30 patents

Neural network circuitry for motors with first plurality of neurons...

Neural network circuitry for motors

Non-volatile memory testing

Semi-conductor component test device, in particular data buffer com...

Semi-conductor component test device with shift register, and semi-...

Device and a process for the calibration of a semiconductor compone...

Inputting and outputting operating parameters for an integrated sem...

Contact plate for use in standardizing tester channels of a tester...

Signal test procedure for testing semi-conductor components and a t...

Semi-conductor component, as well as a process for the in-or output...

Test device for wafer testing digital semiconductor circuits

Calibration device for the calibration of a tester channel of a tes...

Apparatus and method for calibrating a semiconductor test system

Method and device for testing a memory circuit

Method and device for testing set-up time and hold time of signals...

Integrated test circuit

Patents Applicationslast 30 patents

SHUNTLESS MOTOR CONTROL FOR DC MOTORS

NEURAL NETWORK CIRCUITRY FOR MOTORS

NEURAL NETWORK CIRCUITRY FOR MOTORS WITH FIRST PLURALITY OF NEURONS...

NON-VOLATILE MEMORY TESTING

Semi-conductor component test device with shift register, and semi-...

Semiconductor component test procedure, as well as a data buffer co...

Memory buffer

Inputting and outputting operating parameters for an integrated sem...

Semi-conductor component test device, in particular data buffer com...

Semi-conductor component, as well as a process for the in-or output...

Device and a process for the calibration of a semiconductor compone...

Semi-conductor component test procedure, in particular for a system...

Semi-conductor component test procedure, as well as a data buffer c...

Contact plate for use in standardizing tester channels of a tester...

Test device for wafer testing digital semiconductor circuits

Signal test procedure for testing semi-conductor components and a t...

Calibration device for the calibration of a tester channel of a tes...

Apparatus and method for calibrating a semiconductor test system

Integrated test circuit

Method and device for testing a memory circuit

Method and device for testing set-up time and hold time of signals...