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Taufkirchen, DE
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Patents Grants
last 30 patents
Information
Patent Grant
Integrated circuit with on-chip power profiling
Patent number
9,696,775
Issue date
Jul 4, 2017
Intel IP Corporation
Tian Yan Pu
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Accounting for microprocessor resource consumption
Patent number
8,140,885
Issue date
Mar 20, 2012
International Business Machines Corporation
Daniel Becker
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method for switching between two redundant oscillator signals withi...
Patent number
8,055,931
Issue date
Nov 8, 2011
International Business Machines Corporation
Ralf Ludewig
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method for performing a logic built-in-self-test in an electronic c...
Patent number
7,913,136
Issue date
Mar 22, 2011
International Business Machines Corporation
Tilman Gloekler
G01 - MEASURING TESTING
Information
Patent Grant
Method for performing a test case with a LBIST engine on an integra...
Patent number
7,877,655
Issue date
Jan 25, 2011
International Business Machines Corporation
Thuyen Le
G01 - MEASURING TESTING
Information
Patent Grant
Integrated circuit for writing and reading registers distributed ac...
Patent number
7,861,129
Issue date
Dec 28, 2010
International Business Machines Corporation
Thuyen Le
G01 - MEASURING TESTING
Information
Patent Grant
System for performing a serial communication between a central cont...
Patent number
7,788,432
Issue date
Aug 31, 2010
International Business Machines Corporation
Ralf Ludewig
G06 - COMPUTING CALCULATING COUNTING
Patents Applications
last 30 patents
Information
Patent Application
INTEGRATED CIRCUIT WITH ON-CHIP POWER PROFILING
Publication number
20160259397
Publication date
Sep 8, 2016
Tian Yan Pu
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
LOW OVERHEAD ERROR CHECKING AND CORRECTION APPARATUS AND METHOD
Publication number
20160179611
Publication date
Jun 23, 2016
Thuyen Le
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHOD FOR PERFORMING LOGIC BUILT-IN-SELF-TEST CYCLES ON A SEMICOND...
Publication number
20090228751
Publication date
Sep 10, 2009
Tilman Gloekler
G01 - MEASURING TESTING
Information
Patent Application
System for performing a serial communication between a central cont...
Publication number
20090113094
Publication date
Apr 30, 2009
International Business Machines Corporation
Ralf Ludewig
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Method for switching between two redundant oscillator signals withi...
Publication number
20090100283
Publication date
Apr 16, 2009
International Business Machines Corporation
Ralf Ludewig
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Method to Resolve Deadlock in a Bus Architecture Comprising Two Sin...
Publication number
20080276022
Publication date
Nov 6, 2008
International Business Machines Corporation
Thuyen Le
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Integrated Circuit for Writing and Reading Registers Distributed Ac...
Publication number
20080270860
Publication date
Oct 30, 2008
International Business Machines Corporation
Thuyen Le
G01 - MEASURING TESTING
Information
Patent Application
Method for Performing a Logic Built-in-Self-Test in an Electronic C...
Publication number
20080250289
Publication date
Oct 9, 2008
International Business Machines Corporation
Tilman Gloekler
G01 - MEASURING TESTING
Information
Patent Application
Accounting for Microprocessor Resource Consumption
Publication number
20080209245
Publication date
Aug 28, 2008
International Business Machines Corporation
Daniel Becker
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Method and an Arrangement for Arbitrating Requests to Grant Access...
Publication number
20080172508
Publication date
Jul 17, 2008
Tilman Gloekler
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Method for performing a test case with a LBIST engine on an integra...
Publication number
20080072111
Publication date
Mar 20, 2008
International Business Machines Corporation
Thuyen Le
G01 - MEASURING TESTING