TIAN LAN

Person

Beijing, CN

People

Patents Grantslast 30 patents

Information Patent Grant
Methods and devices for processing and retrieving defect informatio...
- Patent number 12,092,587
- Issue date Sep 17, 2024
- BEIJING ZHONGXIANGYING TECHNOLOGY CO., LTD.
- Haijin Wang
- G01 - MEASURING TESTING
Information Patent Grant
System and method for producing display panels based on nonlinear p...
- Patent number 12,066,805
- Issue date Aug 20, 2024
- BOE Technology Group Co., Ltd.
- Weihe Liu
- G05 - CONTROLLING REGULATING
Information Patent Grant
Computer-implemented method for defect analysis, computer-implement...
- Patent number 12,061,935
- Issue date Aug 13, 2024
- BOE Technology Group Co., Ltd.
- Dong Chai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Computer-implemented method for defect analysis, computer-implement...
- Patent number 12,032,364
- Issue date Jul 9, 2024
- BOE Technology Group Co., Ltd.
- Dong Chai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and device of detecting fault in production
- Patent number 11,809,438
- Issue date Nov 7, 2023
- BOE Technology Group Co., Ltd.
- Yue Tang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Data management platform, intelligent defect analysis system, intel...
- Patent number 11,797,557
- Issue date Oct 24, 2023
- BOE Technology Group Co., Ltd.
- Fei Yuan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for recommending maximum quantity of work in proc...
- Patent number 11,703,837
- Issue date Jul 18, 2023
- BOE Technology Group Co., Ltd.
- Guoliang Shen
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method for transferring compound semiconductor single crystal thin...
- Patent number 11,574,839
- Issue date Feb 7, 2023
- Beijing University of Technology
- Zhiyong Wang
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
METHOD, APPARATUS, TERMINAL AND STORAGE MEDIUM FOR INFORMATION PROC...
- Publication number 20240127182
- Publication date Apr 18, 2024
- BEIJING ZITIAO NETWORK TECHNOLOGY CO., LTD.
- Changming Wang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD, APPARATUS, ELECTRONIC DEVICE AND STORAGE MEDIUM FOR INFORMA...
- Publication number 20240126724
- Publication date Apr 18, 2024
- BEIJING ZITIAO NETWORK TECHNOLOGY CO., LTD.
- Changming Wang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD, APPARATUS, TERMINAL AND STORAGE MEDIUM FOR DATA PROCESSING...
- Publication number 20240126975
- Publication date Apr 18, 2024
- BEIJING ZITIAO NETWORK TECHNOLOGY CO., LTD.
- Changming Wang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD, APPARATUS, TERMINAL AND STORAGE MEDIUM FOR SERVICE PROCESSI...
- Publication number 20240126901
- Publication date Apr 18, 2024
- BEIJING ZITIAO NETWORK TECHNOLOGY CO., LTD.
- Changming Wang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD, ELECTRONIC DEVICE AND STORAGE MEDIUM FOR INFORMATION PROCES...
- Publication number 20240127183
- Publication date Apr 18, 2024
- BEIJING ZITIAO NETWORK TECHNOLOGY CO., LTD.
- Changming Wang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHODS AND DEVICES FOR PROCESSING AND RETRIEVING DEFECT INFORMATIO...
- Publication number 20240094141
- Publication date Mar 21, 2024
- Beijing Zhongxiangying Technology Co., Ltd.
- Haijin WANG
- G01 - MEASURING TESTING
Information Patent Application
COMPUTER-IMPLEMENTED METHOD FOR DEFECT ANALYSIS, COMPUTER-IMPLEMENT...
- Publication number 20220374004
- Publication date Nov 24, 2022
- BOE TECHNOLOGY GROUP CO., LTD.
- Dong Chai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DATA MANAGEMENT PLATFORM, INTELLIGENT DEFECT ANALYSIS SYSTEM, INTEL...
- Publication number 20220365945
- Publication date Nov 17, 2022
- BOE TECHNOLOGY GROUP CO., LTD.
- Fei Yuan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PRODUCTION PROGRAMMING SYSTEM AND METHOD BASED ON NONLINEAR PROGRAM...
- Publication number 20220317644
- Publication date Oct 6, 2022
- BOE TECHNOLOGY GROUP CO., LTD.
- Weihe LIU
- G05 - CONTROLLING REGULATING
Information Patent Application
COMPUTER-IMPLEMENTED METHOD FOR DEFECT ANALYSIS, COMPUTER-IMPLEMENT...
- Publication number 20220182442
- Publication date Jun 9, 2022
- BOE TECHNOLOGY GROUP CO., LTD.
- Dong Chai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DATA MANAGEMENT PLATFORM, INTELLIGENT DEFECT ANALYSIS SYSTEM, INTEL...
- Publication number 20220179873
- Publication date Jun 9, 2022
- BOE TECHNOLOGY GROUP CO., LTD.
- Fei Yuan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR RECOMMENDING MAXIMUM QUANTITY OF WORK IN PROC...
- Publication number 20220113710
- Publication date Apr 14, 2022
- BOE TECHNOLOGY GROUP CO., LTD.
- Guoliang SHEN
- G05 - CONTROLLING REGULATING
Information Patent Application
METHOD AND DEVICE OF DETECTING FAULT IN PRODUCTION
- Publication number 20220043812
- Publication date Feb 10, 2022
- BOE TECHNOLOGY GROUP CO., LTD.
- Yue Tang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR ANALYZING CAUSE OF PRODUCT DEFECT, COMPUTER R...
- Publication number 20210364999
- Publication date Nov 25, 2021
- Tian LAN
- G05 - CONTROLLING REGULATING
Information Patent Application
METHOD FOR TRANSFERRING COMPOUND SEMICONDUCTOR SINGLE CRYSTAL THIN...
- Publication number 20210035852
- Publication date Feb 4, 2021
- BEIJING UNIVERSITY OF TECHNOLOGY
- ZHIYONG WANG
- H01 - BASIC ELECTRIC ELEMENTS

Person

Patents Grantslast 30 patents

Methods and devices for processing and retrieving defect informatio...

System and method for producing display panels based on nonlinear p...

Computer-implemented method for defect analysis, computer-implement...

Computer-implemented method for defect analysis, computer-implement...

Method and device of detecting fault in production

Data management platform, intelligent defect analysis system, intel...

System and method for recommending maximum quantity of work in proc...

Method for transferring compound semiconductor single crystal thin...

Patents Applicationslast 30 patents

METHOD, APPARATUS, TERMINAL AND STORAGE MEDIUM FOR INFORMATION PROC...

METHOD, APPARATUS, ELECTRONIC DEVICE AND STORAGE MEDIUM FOR INFORMA...

METHOD, APPARATUS, TERMINAL AND STORAGE MEDIUM FOR DATA PROCESSING...

METHOD, APPARATUS, TERMINAL AND STORAGE MEDIUM FOR SERVICE PROCESSI...

METHOD, ELECTRONIC DEVICE AND STORAGE MEDIUM FOR INFORMATION PROCES...

METHODS AND DEVICES FOR PROCESSING AND RETRIEVING DEFECT INFORMATIO...

COMPUTER-IMPLEMENTED METHOD FOR DEFECT ANALYSIS, COMPUTER-IMPLEMENT...

DATA MANAGEMENT PLATFORM, INTELLIGENT DEFECT ANALYSIS SYSTEM, INTEL...

PRODUCTION PROGRAMMING SYSTEM AND METHOD BASED ON NONLINEAR PROGRAM...

COMPUTER-IMPLEMENTED METHOD FOR DEFECT ANALYSIS, COMPUTER-IMPLEMENT...

DATA MANAGEMENT PLATFORM, INTELLIGENT DEFECT ANALYSIS SYSTEM, INTEL...

SYSTEM AND METHOD FOR RECOMMENDING MAXIMUM QUANTITY OF WORK IN PROC...

METHOD AND DEVICE OF DETECTING FAULT IN PRODUCTION

SYSTEM AND METHOD FOR ANALYZING CAUSE OF PRODUCT DEFECT, COMPUTER R...

METHOD FOR TRANSFERRING COMPOUND SEMICONDUCTOR SINGLE CRYSTAL THIN...