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Patents Grantslast 30 patents

Information Patent Grant
Systems and methods for utilizing scanning probe shape characteriza...
- Patent number 7,578,176
- Issue date Aug 25, 2009
- Veeco Metrology, Inc.
- Tianming Bao
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Systems and methods for utilizing scanning probe shape characteriza...
- Publication number 20080154521
- Publication date Jun 26, 2008
- Tianming Bao
- G01 - MEASURING TESTING