Tianrong ZHAN

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Shanghai, CN

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Patents Grantslast 30 patents

Information Patent Grant
Methods and systems for selecting wafer locations to characterize c...
- Patent number 12,085,515
- Issue date Sep 10, 2024
- KLA Corporation
- Brian C. Lin
- G01 - MEASURING TESTING
Information Patent Grant
Automatic optimization of measurement accuracy through advanced mac...
- Patent number 11,380,594
- Issue date Jul 5, 2022
- KLA-Tencor Corporation
- Tianrong Zhan
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
Flexible Measurement Models For Model Based Measurements Of Semicon...
- Publication number 20250053096
- Publication date Feb 13, 2025
- KLA Corporation
- Houssam Chouaib
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Calibration Of Parametric Measurement Models Based On In-Line Wafer...
- Publication number 20240102941
- Publication date Mar 28, 2024
- KLA Corporation
- Brian C. Lin
- G01 - MEASURING TESTING
Information Patent Application
Methods And Systems For Selecting Wafer Locations To Characterize C...
- Publication number 20230063102
- Publication date Mar 2, 2023
- KLA Corporation
- Brian C. Lin
- G01 - MEASURING TESTING
Information Patent Application
Fleet Matching Of Semiconductor Metrology Tools Without Dedicated Q...
- Publication number 20210375651
- Publication date Dec 2, 2021
- KLA Corporation
- Song Wu
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC OPTIMIZATION OF MEASUREMENT ACCURACY THROUGH ADVANCED MAC...
- Publication number 20190148246
- Publication date May 16, 2019
- KLA-Tencor Corporation
- Tianrong ZHAN
- G06 - COMPUTING CALCULATING COUNTING