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Tianwei Jing
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Tempe, AZ, US
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Patents Grants
last 30 patents
Information
Patent Grant
Surface plasmon resonance imaging system and method for measuring m...
Patent number
11,327,014
Issue date
May 10, 2022
BIOSENSING INSTRUMENT, INC.
Nguyen Ly
C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information
Patent Grant
Surface plasmon resonance imaging system and method for measuring m...
Patent number
10,809,194
Issue date
Oct 20, 2020
BIOSENSING INSTRUMENT INC.
Nguyen Ly
G01 - MEASURING TESTING
Information
Patent Grant
Controlling atomic force microscope using optical imaging
Patent number
8,595,859
Issue date
Nov 26, 2013
Agilent Technologies, Inc.
Christian Rankl
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus for detecting one or more substances and method of detect...
Patent number
7,879,619
Issue date
Feb 1, 2011
Tianwei Jing
G01 - MEASURING TESTING
Information
Patent Grant
Fast scanning stage for a scanning probe microscope
Patent number
7,687,767
Issue date
Mar 30, 2010
Agilent Technologies, Inc.
Stuart M. Lindsay
G01 - MEASURING TESTING
Information
Patent Grant
Pendulum scanner for scanning probe microscope
Patent number
6,748,795
Issue date
Jun 15, 2004
Molecular Imaging Corporation
Tianwei Jing
G01 - MEASURING TESTING
Information
Patent Grant
Scanning probe microscope and solenoid driven cantilever assembly
Patent number
6,734,438
Issue date
May 11, 2004
Molecular Imaging Corporation
Stuart Martin Lindsay
G01 - MEASURING TESTING
Information
Patent Grant
Vibrating tip conducting probe microscope
Patent number
6,245,204
Issue date
Jun 12, 2001
Molecular Imaging Corporation
Stuart M. Lindsay
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Magnetic modulation of force sensor for AC detection in an atomic f...
Patent number
6,134,955
Issue date
Oct 24, 2000
Molecular Imaging Corporation
Wenhai Han
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Force sensing probe for scanning probe microscopy
Patent number
6,121,611
Issue date
Sep 19, 2000
Molecular Imaging Corporation
Stuart M. Lindsay
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Conducting scanning probe microscope with environmental control
Patent number
6,051,825
Issue date
Apr 18, 2000
Molecular Imaging Corporation
Stuart M. Lindsay
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Tip coating system for scanning probe microscopy
Patent number
6,017,590
Issue date
Jan 25, 2000
Molecular Imaging Corporation
Stuart M. Lindsay
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Microscope for compliance measurement
Patent number
5,983,712
Issue date
Nov 16, 1999
Molecular Imaging Corporation
Stuart M. Lindsay
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Cantilevers for a magnetically driven atomic force microscope
Patent number
5,866,805
Issue date
Feb 2, 1999
Molecular Imaging Corporation Arizona Board of Regents
Wenhai Han
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Heated stage for a scanning probe microscope
Patent number
5,821,545
Issue date
Oct 13, 1998
Molecular Imaging Corporation
Stuart M. Lindsay
G01 - MEASURING TESTING
Information
Patent Grant
Hybrid control system for scanning probe microscopes
Patent number
5,805,448
Issue date
Sep 8, 1998
Molecular Imaging Corporation
Stuart M. Lindsay
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Scanning probe microscope
Patent number
5,760,396
Issue date
Jun 2, 1998
Molecular Imaging Corporation
Stuart M. Lindsay
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Magnetically-oscillated probe microscope for operation in liquids
Patent number
5,753,814
Issue date
May 19, 1998
Molecular Imaging Corporation
Wenhai Han
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Scanning probe microscope for use in fluids
Patent number
5,750,989
Issue date
May 12, 1998
Molecular Imaging Corporation
Stuart M. Lindsay
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Scanning probe microscope
Patent number
5,675,154
Issue date
Oct 7, 1997
Molecular Imaging Corporation
Stuart M. Lindsay
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Tip etching system and method for etching platinum-containing wire
Patent number
5,630,932
Issue date
May 20, 1997
Molecular Imaging Corporation
Stuart M. Lindsay
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Stress cell for a scanning probe microscope
Patent number
5,500,535
Issue date
Mar 19, 1996
Molecular Imaging Corporation
Tianwei Jing
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Electrochemical identification of molecules in a scanning probe mic...
Patent number
5,495,109
Issue date
Feb 27, 1996
Molecular Imaging Corporation
Stuart M. Lindsay
B82 - NANO-TECHNOLOGY
Patents Applications
last 30 patents
Information
Patent Application
METHODS FOR RAPID ANALYTE CONCENTRATION ANALYSIS FOR MULTIPLE SAMPLES
Publication number
20230314422
Publication date
Oct 5, 2023
Biosensing Instrument Inc.
Nguyen Ly
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Application
SYSTEM AND METHOD FOR ANALYZING MOLECULAR INTERACTIONS ON LIVING CE...
Publication number
20220260489
Publication date
Aug 18, 2022
Biosensing Instrument Inc.
Nguyen Ly
G01 - MEASURING TESTING
Information
Patent Application
SURFACE PLASMON RESONANCE IMAGING SYSTEM AND METHOD FOR MEASURING M...
Publication number
20210033534
Publication date
Feb 4, 2021
Biosensing Instrument Inc.
Nguyen Ly
G01 - MEASURING TESTING
Information
Patent Application
SURFACE PLASMON RESONANCE IMAGING SYSTEM AND METHOD FOR MEASURING M...
Publication number
20190360932
Publication date
Nov 28, 2019
Biosensing Instrument Inc.
Nguyen Ly
G01 - MEASURING TESTING
Information
Patent Application
Quick validation method for binding kinetic analysis
Publication number
20190302110
Publication date
Oct 3, 2019
Biosensing Instrument Inc.
Nguyen Ly
G01 - MEASURING TESTING
Information
Patent Application
Reducing Noise In Atomic Force Microscopy Measurements
Publication number
20090241648
Publication date
Oct 1, 2009
AGILENT TECHNOLOGIES, INC.
Michael Dieudonne
G01 - MEASURING TESTING
Information
Patent Application
Apparatus for detecting one or more substances and method of detect...
Publication number
20070082408
Publication date
Apr 12, 2007
Tianwei Jing
G01 - MEASURING TESTING
Information
Patent Application
Fast scanning stage for a scanning probe microscope
Publication number
20040129873
Publication date
Jul 8, 2004
Stuart M. Lindsay
G01 - MEASURING TESTING