Tie-Jiang Wu

Person

Kueishan, TW

People

Patents Grantslast 30 patents

Information Patent Grant
Device and method for detecting alignment of active areas and memor...
- Patent number 7,381,575
- Issue date Jun 3, 2008
- Nanya Technology Corporation
- Tie Jiang Wu
- G11 - INFORMATION STORAGE
Information Patent Grant
Misalignment test structure and method thereof
- Patent number 7,217,581
- Issue date May 15, 2007
- Nanya Technology Corporation
- Chien-Chang Huang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Device and method for detecting alignment of active areas and memor...
- Patent number 7,026,647
- Issue date Apr 11, 2006
- Nanya Technology Corporation
- Tie Jiang Wu
- G11 - INFORMATION STORAGE
Information Patent Grant
Misalignment test structure and method thereof
- Patent number 7,015,050
- Issue date Mar 21, 2006
- Nanya Techonolgy Corporation
- Chien-Chang Huang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and device for detecting whether the alignment of bit line c...
- Patent number 6,984,534
- Issue date Jan 10, 2006
- Nanya Technology Corporation
- Tie Jiang Wu
- G11 - INFORMATION STORAGE
Information Patent Grant
Test key for validating the position of a word line overlaying a tr...
- Patent number 6,946,678
- Issue date Sep 20, 2005
- Nanya Technology Corporation
- Tie Jiang Wu
- G11 - INFORMATION STORAGE
Information Patent Grant
Device and method for detecting alignment of deep trench capacitors...
- Patent number 6,902,942
- Issue date Jun 7, 2005
- Nanya Technology Corporation
- Tie-Jiang Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test structure of DRAM
- Patent number 6,891,216
- Issue date May 10, 2005
- Nanya Technology Corporation
- Chien-Chang Huang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and device for detecting whether the alignment of bit line c...
- Patent number 6,844,207
- Issue date Jan 18, 2005
- Nanya Technology Corporation
- Tie Jiang Wu
- G11 - INFORMATION STORAGE
Information Patent Grant
Device and method for detecting alignment of deep trench capacitors...
- Patent number 6,838,296
- Issue date Jan 4, 2005
- Nanya Technology Corporation
- Tie-Jiang Wu
- G11 - INFORMATION STORAGE
Information Patent Grant
Test key and method for validating the position of a word line over...
- Patent number 6,825,053
- Issue date Nov 30, 2004
- Nanya Technology Corporation
- Tie Jiang Wu
- G11 - INFORMATION STORAGE
Information Patent Grant
Test key and method for validating the doping concentration of buri...
- Patent number 6,812,487
- Issue date Nov 2, 2004
- Nanya Technology Corporation
- Tie-Jiang Wu
- G11 - INFORMATION STORAGE
Information Patent Grant
Device and method for detecting alignment of deep trench capacitors...
- Patent number 6,801,462
- Issue date Oct 5, 2004
- Nanya Technology Corporation
- Ming Cheng Chang
- G11 - INFORMATION STORAGE
Information Patent Grant
Test key for detecting overlap between active area and deep trench...
- Patent number 6,788,598
- Issue date Sep 7, 2004
- Nanya Technology Corporation
- Ming-Cheng Chang
- G11 - INFORMATION STORAGE
Information Patent Grant
Device and method for detecting alignment of bit lines and bit line...
- Patent number 6,693,834
- Issue date Feb 17, 2004
- Nanya Technology Corporation
- Tie Jiang Wu
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
Misalignment test structure and method thereof
- Publication number 20060128041
- Publication date Jun 15, 2006
- NANYA TECHNOLOGY CORPORATION
- Chien-Chang Huang
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Device and method for detecting alignment of active areas and memor...
- Publication number 20050184289
- Publication date Aug 25, 2005
- NANYA TECHNOLOGY CORPORATION
- Tie Jiang Wu
- G11 - INFORMATION STORAGE
Information Patent Application
Test key and method for validating the position of a word line over...
- Publication number 20050002221
- Publication date Jan 6, 2005
- NANYA TECHNOLOGY CORPORATION
- Tie Jiang Wu
- G11 - INFORMATION STORAGE
Information Patent Application
Method for forming a crown capacitor
- Publication number 20040241954
- Publication date Dec 2, 2004
- NANYA TECHNOLOGY CORPORATION
- Yi-Nan Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and device for detecting whether the alignment of bit line c...
- Publication number 20040179409
- Publication date Sep 16, 2004
- NANYA TECHNOLOGY CORPORATION
- Tie Jiang Wu
- G11 - INFORMATION STORAGE
Information Patent Application
Misalignment test structure and method thereof
- Publication number 20040124412
- Publication date Jul 1, 2004
- Chien-Chang Huang
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Device and method for detecting alignment of active areas and memor...
- Publication number 20040082087
- Publication date Apr 29, 2004
- NANYA TECHNOLOGY CORPORATION
- Tie Jiang Wu
- G11 - INFORMATION STORAGE
Information Patent Application
Device and method for detecting alignment of deep trench capacitors...
- Publication number 20040076056
- Publication date Apr 22, 2004
- NANYA TECHNOLOGY CORPORATION
- Ming Cheng Chang
- G11 - INFORMATION STORAGE
Information Patent Application
Device and method for detecting alignment of deep trench capacitors...
- Publication number 20040069989
- Publication date Apr 15, 2004
- NANYA TECHNOLOGY CORPORATION
- Tie Jiang Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Test key and method for validating the position of a word line over...
- Publication number 20040031960
- Publication date Feb 19, 2004
- NANYA TECHNOLOGY CORPORATION
- Tie Jiang Wu
- G11 - INFORMATION STORAGE
Information Patent Application
Device and method for detecting alignment of deep trench capacitors...
- Publication number 20040033634
- Publication date Feb 19, 2004
- NANYA TECHNOLOGY CORPORATION
- Tie-Jiang Wu
- G11 - INFORMATION STORAGE
Information Patent Application
Method and device for detecting whether the alignment of bit line c...
- Publication number 20040029301
- Publication date Feb 12, 2004
- NANYA TECHNOLOGY CORPORATION
- Tie Jiang Wu
- G11 - INFORMATION STORAGE
Information Patent Application
Test key for detecting overlap between active area and deep trench...
- Publication number 20040017710
- Publication date Jan 29, 2004
- NANYA TECHNOLOGY CORPORATION
- Ming-Cheng Chang
- G11 - INFORMATION STORAGE

Tie-Jiang Wu

Person

Patents Grantslast 30 patents

Device and method for detecting alignment of active areas and memor...

Misalignment test structure and method thereof

Device and method for detecting alignment of active areas and memor...

Misalignment test structure and method thereof

Method and device for detecting whether the alignment of bit line c...

Test key for validating the position of a word line overlaying a tr...

Device and method for detecting alignment of deep trench capacitors...

Test structure of DRAM

Method and device for detecting whether the alignment of bit line c...

Device and method for detecting alignment of deep trench capacitors...

Test key and method for validating the position of a word line over...

Test key and method for validating the doping concentration of buri...

Device and method for detecting alignment of deep trench capacitors...

Test key for detecting overlap between active area and deep trench...

Device and method for detecting alignment of bit lines and bit line...

Patents Applicationslast 30 patents

Misalignment test structure and method thereof

Device and method for detecting alignment of active areas and memor...

Test key and method for validating the position of a word line over...

Method for forming a crown capacitor

Method and device for detecting whether the alignment of bit line c...

Misalignment test structure and method thereof

Device and method for detecting alignment of active areas and memor...

Device and method for detecting alignment of deep trench capacitors...

Device and method for detecting alignment of deep trench capacitors...

Test key and method for validating the position of a word line over...

Device and method for detecting alignment of deep trench capacitors...

Method and device for detecting whether the alignment of bit line c...

Test key for detecting overlap between active area and deep trench...