Tien-Chia LI

Person

Hsinchu County, TW

People

Patents Grantslast 30 patents

Information Patent Grant
Vertical probe device and supporter used in the same
- Patent number 10,119,991
- Issue date Nov 6, 2018
- MPI Corporation
- Tsung-Yi Chen
- G01 - MEASURING TESTING
Information Patent Grant
Probe head of vertical probe card
- Patent number 10,041,974
- Issue date Aug 7, 2018
- MPI CORPORATION
- Tien-Chia Li
- G01 - MEASURING TESTING
Information Patent Grant
Testing device and assembling method thereof
- Patent number 9,857,393
- Issue date Jan 2, 2018
- Chin-Yi Lin
- G01 - MEASURING TESTING
Information Patent Grant
Wafer testing probe card
- Patent number 9,823,272
- Issue date Nov 21, 2017
- MPI CORPORATION
- Ming-Chi Chen
- G01 - MEASURING TESTING
Information Patent Grant
Positioner of probe card and probe head of probe card
- Patent number 9,638,716
- Issue date May 2, 2017
- MPI CORPORATION
- Tzu-Yang Chen
- G01 - MEASURING TESTING
Information Patent Grant
Probe needle and probe module using the same
- Patent number 9,618,536
- Issue date Apr 11, 2017
- MPI Corporation
- Chia-Yuan Kuo
- G01 - MEASURING TESTING
Information Patent Grant
Probe device having spring probe
- Patent number 9,588,141
- Issue date Mar 7, 2017
- MPI Corporation
- Tsung-Yi Chen
- G01 - MEASURING TESTING
Information Patent Grant
Spring probe
- Patent number 9,535,092
- Issue date Jan 3, 2017
- MPI Corporation
- Ting-Hsin Kuo
- G01 - MEASURING TESTING
Information Patent Grant
Assembling method and maintaining method for vertical probe device
- Patent number 9,465,050
- Issue date Oct 11, 2016
- MPI Corporation
- Tsung-Yi Chen
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PROBE HEAD
- Publication number 20170122978
- Publication date May 4, 2017
- MPI Corporation
- Tien-Chia LI
- G01 - MEASURING TESTING
Information Patent Application
SPRING PROBE HAVING OUTER SLEEVE AND PROBE DEVICE HAVING THE SAME
- Publication number 20170097376
- Publication date Apr 6, 2017
- MPI Corporation
- Yi-Ching CHOU
- G01 - MEASURING TESTING
Information Patent Application
TESTING DEVICE AND ASSEMBLING METHOD THEREOF
- Publication number 20160223586
- Publication date Aug 4, 2016
- Chin-Yi LIN
- G01 - MEASURING TESTING
Information Patent Application
POSITIONER OF PROBE CARD AND PROBE HEAD OF PROBE CARD
- Publication number 20150377926
- Publication date Dec 31, 2015
- MPI Corporation
- Tzu-Yang Chen
- G01 - MEASURING TESTING
Information Patent Application
VERTICAL PROBE DEVICE AND SUPPORTER USED IN THE SAME
- Publication number 20150276800
- Publication date Oct 1, 2015
- MPI Corporation
- Tsung-Yi CHEN
- G01 - MEASURING TESTING
Information Patent Application
PROBE DEVICE HAVING SPRING PROBE
- Publication number 20150276807
- Publication date Oct 1, 2015
- MPI Corporation
- Tsung-Yi CHEN
- G01 - MEASURING TESTING
Information Patent Application
SPRING PROBE
- Publication number 20150253356
- Publication date Sep 10, 2015
- MPI Corporation
- Ting-Hsin KUO
- G01 - MEASURING TESTING
Information Patent Application
ASSEMBLING METHOD AND MAINTAINING METHOD FOR VERTICAL PROBE DEVICE
- Publication number 20150253358
- Publication date Sep 10, 2015
- MPI Corporation
- Tsung-Yi CHEN
- G01 - MEASURING TESTING
Information Patent Application
Probe Needle and Probe Module Using the Same
- Publication number 20140352460
- Publication date Dec 4, 2014
- MPI Corporation
- Chia-Yuan KUO
- G01 - MEASURING TESTING
Information Patent Application
WAFER TESTING PROBE CARD
- Publication number 20140210505
- Publication date Jul 31, 2014
- MPI Corporation
- Ming-Chi CHEN
- G01 - MEASURING TESTING

Tien-Chia LI

Person

Patents Grantslast 30 patents

Vertical probe device and supporter used in the same

Probe head of vertical probe card

Testing device and assembling method thereof

Wafer testing probe card

Positioner of probe card and probe head of probe card

Probe needle and probe module using the same

Probe device having spring probe

Spring probe

Assembling method and maintaining method for vertical probe device

Patents Applicationslast 30 patents

PROBE HEAD

SPRING PROBE HAVING OUTER SLEEVE AND PROBE DEVICE HAVING THE SAME

TESTING DEVICE AND ASSEMBLING METHOD THEREOF

POSITIONER OF PROBE CARD AND PROBE HEAD OF PROBE CARD

VERTICAL PROBE DEVICE AND SUPPORTER USED IN THE SAME

PROBE DEVICE HAVING SPRING PROBE

SPRING PROBE

ASSEMBLING METHOD AND MAINTAINING METHOD FOR VERTICAL PROBE DEVICE

Probe Needle and Probe Module Using the Same

WAFER TESTING PROBE CARD