TIEN-WEI CHIANG

Person

TAIPEI CITY, TW

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor structure integrated with magnetic tunneling junction
- Patent number 11,930,645
- Issue date Mar 12, 2024
- Taiwan Semiconductor Manufacturing Company Ltd.
- Alexander Kalnitsky
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor device
- Patent number 11,832,452
- Issue date Nov 28, 2023
- Taiwan Semiconductor Manufacturing Company Ltd.
- Harry-Hak-Lay Chuang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Package structure and method for fabricating the same
- Patent number 11,749,617
- Issue date Sep 5, 2023
- Taiwan Semiconductor Manufacturing Company Ltd.
- Harry-Hak-Lay Chuang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Magnetoresistive random-access memory (MRAM) random number generato...
- Patent number 11,726,747
- Issue date Aug 15, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd
- Harry-Hak-Lay Chuang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor wafer testing system and related method for improving...
- Patent number 11,719,742
- Issue date Aug 8, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd
- Harry-Hak-Lay Chuang
- G11 - INFORMATION STORAGE
Information Patent Grant
DC and AC magnetic field protection for MRAM device using magnetic-...
- Patent number 11,715,702
- Issue date Aug 1, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd
- Harry-Hak-Lay Chuang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Manufacturing techniques and corresponding devices for magnetic tun...
- Patent number 11,653,572
- Issue date May 16, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd
- Harry-Hak-Lay Chuang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor structure integrated with magnetic tunneling junction
- Patent number 11,600,661
- Issue date Mar 7, 2023
- Taiwan Semiconductor Manufacturing Company Ltd.
- Alexander Kalnitsky
- G11 - INFORMATION STORAGE
Information Patent Grant
Magnetoresistive random-access memory (MRAM) random number generato...
- Patent number 11,531,524
- Issue date Dec 20, 2022
- Taiwan Semiconductor Manufacturing Company, Ltd
- Harry-Hak-Lay Chuang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor wafer testing system and related method for improving...
- Patent number 11,506,706
- Issue date Nov 22, 2022
- Taiwan Semiconductor Manufacturing Company, Ltd
- Harry-Hak-Lay Chuang
- G11 - INFORMATION STORAGE
Information Patent Grant
Package structure and method for fabricating the same
- Patent number 11,380,626
- Issue date Jul 5, 2022
- Taiwan Semiconductor Manufacturing Company Ltd.
- Harry-Hak-Lay Chuang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Devices and methods having magnetic shielding layer
- Patent number 11,276,649
- Issue date Mar 15, 2022
- Taiwan Semiconductor Manufacturing Co., Ltd
- Harry-Hak-Lay Chuang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test apparatus and testing method using the same
- Patent number 11,249,131
- Issue date Feb 15, 2022
- Taiwan Semiconductor Manufacturing Company Ltd.
- Harry-Hak-Lay Chuang
- G01 - MEASURING TESTING
Information Patent Grant
Protection of MRAM from external magnetic field using magnetic-fiel...
- Patent number 11,139,341
- Issue date Oct 5, 2021
- Taiwan Semiconductor Manufacturing Company, Ltd
- Kuo-An Liu
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor device
- Patent number 11,088,199
- Issue date Aug 10, 2021
- Taiwan Semiconductor Manufacturing Company Ltd.
- Harry-Hak-Lay Chuang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
DC and AC magnetic field protection for MRAM device using magnetic-...
- Patent number 11,088,083
- Issue date Aug 10, 2021
- Taiwan Semiconductor Manufacturing Company, Ltd
- Harry-Hak-Lay Chuang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor structure integrated with magnetic tunneling junction
- Patent number 11,037,982
- Issue date Jun 15, 2021
- Taiwan Semiconductor Manufacturing Company Ltd.
- Alexander Kalnitsky
- G01 - MEASURING TESTING
Information Patent Grant
Integration of magneto-resistive random access memory and capacitor
- Patent number 10,971,544
- Issue date Apr 6, 2021
- Taiwan Semiconductor Manufacturing Company, Ltd
- Chung-Cheng Chou
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Manufacturing techniques and corresponding devices for magnetic tun...
- Patent number 10,937,957
- Issue date Mar 2, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd
- Harry-Hak-Lay Chuang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
One-time-programmable (OTP) implementation using magnetic junctions
- Patent number 10,878,928
- Issue date Dec 29, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd
- Harry-Hak-Lay Chuang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor wafer testing system and related method for improving...
- Patent number 10,877,089
- Issue date Dec 29, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd
- Harry-Hak-Lay Chuang
- G01 - MEASURING TESTING
Information Patent Grant
Storage device having magnetic tunnel junction cells of different s...
- Patent number 10,868,234
- Issue date Dec 15, 2020
- Taiwan Semiconductor Manufacturing Company Ltd.
- Harry-Hak-Lay Chuang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Package structure and method for fabricating the same
- Patent number 10,818,609
- Issue date Oct 27, 2020
- Taiwan Semiconductor Manufacturing Company Ltd.
- Harry-Hak-Lay Chuang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for testing MRAM device and test apparatus thereof
- Patent number 10,665,321
- Issue date May 26, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd
- Chia-Yu Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integration of magneto-resistive random access memory and capacitor
- Patent number 10,522,591
- Issue date Dec 31, 2019
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chung-Cheng Chou
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and method of manufacturing the same
- Patent number 10,510,802
- Issue date Dec 17, 2019
- Taiwan Semiconductor Manufacturing Company Ltd.
- Harry-Hak-Lay Chuang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor structure integrated with magnetic tunneling junction...
- Patent number 10,510,804
- Issue date Dec 17, 2019
- Taiwan Semiconductor Manufacturing Company Ltd.
- Alexander Kalnitsky
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Manufacturing techniques and corresponding devices for magnetic tun...
- Patent number 10,497,861
- Issue date Dec 3, 2019
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Harry-Hak-Lay Chuang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Elongated magnetoresistive tunnel junction structure
- Patent number 10,096,767
- Issue date Oct 9, 2018
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chwen Yu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor structure integrated with magnetic tunneling junction...
- Patent number 10,068,945
- Issue date Sep 4, 2018
- Taiwan Semiconductor Manufacturing Company Ltd.
- Alexander Kalnitsky
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
EXTERNAL MAGNETIC FIELD DETECTION FOR MRAM DEVICE
- Publication number 20240371459
- Publication date Nov 7, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Harry-Hak-Lay Chuang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR FABRICATING SEMICONDUCTOR DEVICE
- Publication number 20240341102
- Publication date Oct 10, 2024
- Taiwan Semiconductor Manufacturing company Ltd.
- ALEXANDER KALNITSKY
- G11 - INFORMATION STORAGE
Information Patent Application
Magnetoresistive Random-Access Memory (MRAM) Cell and Method of Ope...
- Publication number 20240339144
- Publication date Oct 10, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Harry-Hak-Lay Chuang
- G11 - INFORMATION STORAGE
Information Patent Application
SHIELDING FOR REDUCING ELECTROMAGNETIC INTERFERENCE AND MAGNETIC IN...
- Publication number 20240096818
- Publication date Mar 21, 2024
- Taiwan Semiconductor Manufacturing Company Limited
- Harry-Hak-Lay Chuang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20240057344
- Publication date Feb 15, 2024
- Taiwan Semiconductor Manufacturing company Ltd.
- HARRY-HAK-LAY CHUANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE, METHOD OF FABRICATING SEMICONDUCTOR DEVICE, A...
- Publication number 20230371277
- Publication date Nov 16, 2023
- Taiwan Semiconductor Manufacturing company Ltd.
- ALEXANDER KALNITSKY
- G11 - INFORMATION STORAGE
Information Patent Application
PACKAGE STRUCTURE AND METHOD FOR FABRICATING THE SAME
- Publication number 20230361050
- Publication date Nov 9, 2023
- Taiwan Semiconductor Manufacturing company Ltd.
- HARRY-HAK-LAY CHUANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR WAFER TESTING SYSTEM AND RELATED METHOD FOR IMPROVING...
- Publication number 20230333157
- Publication date Oct 19, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Harry-Hak-Lay Chuang
- G01 - MEASURING TESTING
Information Patent Application
DC AND AC MAGNETIC FIELD PROTECTION FOR MRAM DEVICE USING MAGNETIC-...
- Publication number 20230317629
- Publication date Oct 5, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Harry-Hak-Lay Chuang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR STRUCTURE INTEGRATED WITH MAGNETIC TUNNELING JUNCTION
- Publication number 20230225136
- Publication date Jul 13, 2023
- Taiwan Semiconductor Manufacturing company Ltd.
- ALEXANDER KALNITSKY
- G11 - INFORMATION STORAGE
Information Patent Application
EXTERNAL MAGNETIC FIELD DETECTION FOR MRAM DEVICE
- Publication number 20230207045
- Publication date Jun 29, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Harry-Hak-Lay Chuang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MAGNETORESISTIVE RANDOM-ACCESS MEMORY (MRAM) RANDOM NUMBER GENERATO...
- Publication number 20230115281
- Publication date Apr 13, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Harry-Hak-Lay Chuang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INTEGRATED CIRCUIT DEVICE AND METHOD FOR FABRICATING THE SAME
- Publication number 20230065850
- Publication date Mar 2, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Yuan-Jen LEE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR WAFER TESTING SYSTEM AND RELATED METHOD FOR IMPROVING...
- Publication number 20220373594
- Publication date Nov 24, 2022
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Harry-Hak-Lay Chuang
- G11 - INFORMATION STORAGE
Information Patent Application
PACKAGE STRUCTURE AND MANUFACTURING METHOD THEREOF
- Publication number 20220344578
- Publication date Oct 27, 2022
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Harry-Hak-Lay CHUANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PACKAGE STRUCTURE AND METHOD FOR FABRICATING THE SAME
- Publication number 20220328423
- Publication date Oct 13, 2022
- Taiwan Semiconductor Manufacturing company Ltd.
- HARRY-HAK-LAY CHUANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DC AND AC MAGNETIC FIELD PROTECTION FOR MRAM DEVICE USING MAGNETIC-...
- Publication number 20210366840
- Publication date Nov 25, 2021
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Harry-Hak-Lay Chuang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20210359001
- Publication date Nov 18, 2021
- Taiwan Semiconductor Manufacturing company Ltd.
- HARRY-HAK-LAY CHUANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TEST APPARATUS AND TESTING METHOD USING THE SAME
- Publication number 20210311105
- Publication date Oct 7, 2021
- Taiwan Semiconductor Manufacturing company Ltd.
- HARRY-HAK-LAY CHUANG
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR STRUCTURE INTEGRATED WITH MAGNETIC TUNNELING JUNCTION
- Publication number 20210305317
- Publication date Sep 30, 2021
- Taiwan Semiconductor Manufacturing company Ltd.
- ALEXANDER KALNITSKY
- G01 - MEASURING TESTING
Information Patent Application
MANUFACTURING TECHNIQUES AND CORRESPONDING DEVICES FOR MAGNETIC TUN...
- Publication number 20210184110
- Publication date Jun 17, 2021
- Taiwan Semiconductor Manufacturing Co., LTD
- Harry-Hak-Lay Chuang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR WAFER TESTING SYSTEM AND RELATED METHOD FOR IMPROVING...
- Publication number 20210109152
- Publication date Apr 15, 2021
- Taiwan Semiconductor Manufacturing Co., LTD
- Harry-Hak-Lay Chuang
- G11 - INFORMATION STORAGE
Information Patent Application
PACKAGE STRUCTURE AND METHOD FOR FABRICATING THE SAME
- Publication number 20210043582
- Publication date Feb 11, 2021
- Taiwan Semiconductor Manufacturing company Ltd.
- HARRY-HAK-LAY CHUANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEVICES AND METHODS HAVING MAGNETIC SHIELDING LAYER
- Publication number 20200411449
- Publication date Dec 31, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Harry-Hak-Lay Chuang
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
STORAGE DEVICE HAVING MAGNETIC TUNNEL JUNCTION CELLS OF DIFFERENT S...
- Publication number 20200194662
- Publication date Jun 18, 2020
- Taiwan Semiconductor Manufacturing company Ltd.
- HARRY-HAK-LAY CHUANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR STRUCTURE INTEGRATED WITH MAGNETIC TUNNELING JUNCTION
- Publication number 20200127049
- Publication date Apr 23, 2020
- Taiwan Semiconductor Manufacturing company Ltd.
- ALEXANDER KALNITSKY
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20200119091
- Publication date Apr 16, 2020
- Taiwan Semiconductor Manufacturing company Ltd.
- HARRY-HAK-LAY CHUANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MAGNETORESISTIVE RANDOM-ACCESS MEMORY (MRAM) RANDOM NUMBER GENERATO...
- Publication number 20200097255
- Publication date Mar 26, 2020
- Taiwan Semiconductor Manufacturing Co., LTD
- Harry-Hak-Lay Chuang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ONE-TIME-PROGRAMMABLE (OTP) IMPLEMENTATION USING MAGNETIC JUNCTIONS
- Publication number 20200098440
- Publication date Mar 26, 2020
- Taiwan Semiconductor Manufacturing Co., LTD
- Harry-Hak-Lay Chuang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR WAFER TESTING SYSTEM AND RELATED METHOD FOR IMPROVING...
- Publication number 20200096559
- Publication date Mar 26, 2020
- Taiwan Semiconductor Manufacturing Co., LTD
- Harry-Hak-Lay Chuang
- G01 - MEASURING TESTING

TIEN-WEI CHIANG

Person

Patents Grantslast 30 patents

Semiconductor structure integrated with magnetic tunneling junction

Semiconductor device

Package structure and method for fabricating the same

Magnetoresistive random-access memory (MRAM) random number generato...

Semiconductor wafer testing system and related method for improving...

DC and AC magnetic field protection for MRAM device using magnetic-...

Manufacturing techniques and corresponding devices for magnetic tun...

Semiconductor structure integrated with magnetic tunneling junction

Magnetoresistive random-access memory (MRAM) random number generato...

Semiconductor wafer testing system and related method for improving...

Package structure and method for fabricating the same

Devices and methods having magnetic shielding layer

Test apparatus and testing method using the same

Protection of MRAM from external magnetic field using magnetic-fiel...

Semiconductor device

DC and AC magnetic field protection for MRAM device using magnetic-...

Semiconductor structure integrated with magnetic tunneling junction

Integration of magneto-resistive random access memory and capacitor

Manufacturing techniques and corresponding devices for magnetic tun...

One-time-programmable (OTP) implementation using magnetic junctions

Semiconductor wafer testing system and related method for improving...

Storage device having magnetic tunnel junction cells of different s...

Package structure and method for fabricating the same

Method for testing MRAM device and test apparatus thereof

Integration of magneto-resistive random access memory and capacitor

Semiconductor device and method of manufacturing the same

Semiconductor structure integrated with magnetic tunneling junction...

Manufacturing techniques and corresponding devices for magnetic tun...

Elongated magnetoresistive tunnel junction structure

Semiconductor structure integrated with magnetic tunneling junction...

Patents Applicationslast 30 patents

EXTERNAL MAGNETIC FIELD DETECTION FOR MRAM DEVICE

METHOD FOR FABRICATING SEMICONDUCTOR DEVICE

Magnetoresistive Random-Access Memory (MRAM) Cell and Method of Ope...

SHIELDING FOR REDUCING ELECTROMAGNETIC INTERFERENCE AND MAGNETIC IN...

SEMICONDUCTOR DEVICE

SEMICONDUCTOR DEVICE, METHOD OF FABRICATING SEMICONDUCTOR DEVICE, A...

PACKAGE STRUCTURE AND METHOD FOR FABRICATING THE SAME

SEMICONDUCTOR WAFER TESTING SYSTEM AND RELATED METHOD FOR IMPROVING...

DC AND AC MAGNETIC FIELD PROTECTION FOR MRAM DEVICE USING MAGNETIC-...

SEMICONDUCTOR STRUCTURE INTEGRATED WITH MAGNETIC TUNNELING JUNCTION

EXTERNAL MAGNETIC FIELD DETECTION FOR MRAM DEVICE

MAGNETORESISTIVE RANDOM-ACCESS MEMORY (MRAM) RANDOM NUMBER GENERATO...

INTEGRATED CIRCUIT DEVICE AND METHOD FOR FABRICATING THE SAME

SEMICONDUCTOR WAFER TESTING SYSTEM AND RELATED METHOD FOR IMPROVING...

PACKAGE STRUCTURE AND MANUFACTURING METHOD THEREOF

PACKAGE STRUCTURE AND METHOD FOR FABRICATING THE SAME

DC AND AC MAGNETIC FIELD PROTECTION FOR MRAM DEVICE USING MAGNETIC-...

SEMICONDUCTOR DEVICE

TEST APPARATUS AND TESTING METHOD USING THE SAME

SEMICONDUCTOR STRUCTURE INTEGRATED WITH MAGNETIC TUNNELING JUNCTION

MANUFACTURING TECHNIQUES AND CORRESPONDING DEVICES FOR MAGNETIC TUN...

SEMICONDUCTOR WAFER TESTING SYSTEM AND RELATED METHOD FOR IMPROVING...

PACKAGE STRUCTURE AND METHOD FOR FABRICATING THE SAME

DEVICES AND METHODS HAVING MAGNETIC SHIELDING LAYER

STORAGE DEVICE HAVING MAGNETIC TUNNEL JUNCTION CELLS OF DIFFERENT S...

SEMICONDUCTOR STRUCTURE INTEGRATED WITH MAGNETIC TUNNELING JUNCTION

SEMICONDUCTOR DEVICE

MAGNETORESISTIVE RANDOM-ACCESS MEMORY (MRAM) RANDOM NUMBER GENERATO...

ONE-TIME-PROGRAMMABLE (OTP) IMPLEMENTATION USING MAGNETIC JUNCTIONS

SEMICONDUCTOR WAFER TESTING SYSTEM AND RELATED METHOD FOR IMPROVING...