Tijs Frans TEEPEN

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TILBURG, NL

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Patents Grantslast 30 patents

Information Patent Grant
Lithography system, sensor and measuring method
- Patent number RE49602
- Issue date Aug 8, 2023
- ASML Netherlands B.V.
- Pieter Kruit
Information Patent Grant
Lithography system, sensor and measuring method
- Patent number RE48046
- Issue date Jun 9, 2020
- ASML Netherlands B.V.
- Pieter Kruit
Information Patent Grant
Lithography system, sensor and measuring method
- Patent number RE45206
- Issue date Oct 28, 2014
- Mapper Lithography IP B.V.
- Pieter Kruit
- 250 - Radiant energy
Information Patent Grant
Charged particle lithography apparatus and method of generating vac...
- Patent number 8,690,005
- Issue date Apr 8, 2014
- Mapper Lithography IP B.V.
- Sander Baltussen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Lithography system, sensor and measuring method
- Patent number 7,868,300
- Issue date Jan 11, 2011
- Mapper Lithography IP B.V.
- Pieter Kruit
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
CHARGED PARTICLE LITHOGRAPHY APPARATUS AND METHOD OF GENERATING VAC...
- Publication number 20110042579
- Publication date Feb 24, 2011
- MAPPER LITHOGRAPHY IP BV
- Guido DE BOER
- B82 - NANO-TECHNOLOGY
Information Patent Application
CHARGED PARTICLE LITHOGRAPHY APPARATUS AND METHOD OF GENERATING VAC...
- Publication number 20100270299
- Publication date Oct 28, 2010
- MAPPER LITHOGRAPHY IP BV
- Sander BALTUSSEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Lithography system, sensor and measuring method
- Publication number 20070057204
- Publication date Mar 15, 2007
- Pieter Kruit
- B82 - NANO-TECHNOLOGY