Tilak Jain

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Encinitas, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Apparatus and method for producing specimens for electron microscopy
- Patent number 10,241,011
- Issue date Mar 26, 2019
- The Scripps Research Institute
- Bridget Carragher
- G01 - MEASURING TESTING
Information Patent Grant
Preparation of specimen arrays on an EM grid
- Patent number 9,952,128
- Issue date Apr 24, 2018
- The Scripps Research Institute
- Bridget Carragher
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for producing specimens for electron microscopy
- Patent number 9,702,795
- Issue date Jul 11, 2017
- The Scripps Research Institute
- Bridget Carragher
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Preparation of specimen arrays on an EM grid
- Patent number 9,594,008
- Issue date Mar 14, 2017
- The Scripps Research Institute
- Bridget Carragher
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
APPARATUS AND METHOD FOR PRODUCING SPECIMENS FOR ELECTRON MICROSCOPY
- Publication number 20170350798
- Publication date Dec 7, 2017
- Bridget Carragher
- G01 - MEASURING TESTING
Information Patent Application
PREPARATION OF SPECIMEN ARRAYS ON AN EM GRID
- Publication number 20170025250
- Publication date Jan 26, 2017
- Bridget Carragher
- G01 - MEASURING TESTING
Information Patent Application
Preparation of Specimen Arrays on an EM Grid
- Publication number 20150090899
- Publication date Apr 2, 2015
- Bridget Carragher
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and Method for Producing Specimens for Electron Microscopy
- Publication number 20140360286
- Publication date Dec 11, 2014
- Bridget Carragher
- G01 - MEASURING TESTING