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Tilo Lilienblum
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Magdeburg, DE
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Patents Grants
last 30 patents
Information
Patent Grant
Method for capturing images of a preferably structured surface of a...
Patent number
10,869,020
Issue date
Dec 15, 2020
INB Vision AG.
Wolfram Schmidt
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method and device for detecting deviations of an object surface
Patent number
10,101,153
Issue date
Oct 16, 2018
INB Vision AG.
Bernd Michaelis
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Device and method for measuring surfaces
Patent number
9,418,449
Issue date
Aug 16, 2016
INB Vision AG.
Tilo Lilienblum
G01 - MEASURING TESTING
Information
Patent Grant
Method of detecting flaws in the structure of a surface
Patent number
7,149,337
Issue date
Dec 12, 2006
INB Vision AG.
Bernd Michaelis
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method of defining deviations of pixel positions
Patent number
7,072,505
Issue date
Jul 4, 2006
INB Vision AG.
Tilo Lilienblum
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Patents Applications
last 30 patents
Information
Patent Application
METHOD FOR CAPTURING IMAGES OF A PREFERABLY STRUCTURED SURFACE OF A...
Publication number
20150324991
Publication date
Nov 12, 2015
INB VISION AG
Wolfram Schmidt
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND DEVICE FOR DETECTING DEVIATIONS OF AN OBJECT SURFACE
Publication number
20150276397
Publication date
Oct 1, 2015
INB VISION AG
Bernd Michaelis
G01 - MEASURING TESTING
Information
Patent Application
DEVICE AND METHOD FOR MEASURING SURFACES
Publication number
20150078651
Publication date
Mar 19, 2015
INB VISION AG
Tilo Lilienblum
G01 - MEASURING TESTING
Information
Patent Application
DEVICE AND METHOD FOR THE OPTICAL 3D MEASUREMENT OF SURFACES
Publication number
20140009584
Publication date
Jan 9, 2014
Tilo Lilienblum
G01 - MEASURING TESTING
Information
Patent Application
Method of defining deviations of pixel positions
Publication number
20020146165
Publication date
Oct 10, 2002
Tilo Lilienblum
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
3-D measurements of improved accuracy
Publication number
20020089673
Publication date
Jul 11, 2002
Tilo Lilienblum
G01 - MEASURING TESTING
Information
Patent Application
Method of detecting flaws in the structure of a surface
Publication number
20020072874
Publication date
Jun 13, 2002
Bernd Michaelis
G01 - MEASURING TESTING