Tim H. Bossart

Person

Boise, ID, US

People

Patents Grantslast 30 patents

Information Patent Grant
Methods of forming semiconductor devices
- Patent number 10,811,355
- Issue date Oct 20, 2020
- Micron Technology, Inc.
- William R. Brown
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor devices including conductive lines and methods of for...
- Patent number 10,388,601
- Issue date Aug 20, 2019
- Micron Technology, Inc.
- William R. Brown
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor devices including conductive lines and methods of for...
- Patent number 9,911,693
- Issue date Mar 6, 2018
- Micron Technology, Inc.
- William R. Brown
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods of correcting for variation across substrates during photol...
- Patent number 8,658,336
- Issue date Feb 25, 2014
- Micron Technology, Inc.
- Yuan He
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Residue free overlay target
- Patent number 6,914,017
- Issue date Jul 5, 2005
- Micron Technology, Inc.
- Pary Baluswamy
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Raised-lines overlay semiconductor targets and method of making the...
- Patent number 6,822,342
- Issue date Nov 23, 2004
- Micron Technology, Inc.
- Pary Baluswamy
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Layout for measurement of overlay error
- Patent number 6,675,053
- Issue date Jan 6, 2004
- Micron Technology, Inc.
- Pary Baluswamy
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Layout for measurement of overlay error
- Patent number 6,484,060
- Issue date Nov 19, 2002
- Micron Technology, Inc.
- Pary Baluswamy
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for improved coating of a semiconductor wafer
- Patent number 5,952,045
- Issue date Sep 14, 1999
- Micron Technology, Inc.
- Tim Bossart
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
METHODS OF FORMING SEMICONDUCTOR DEVICES
- Publication number 20190103350
- Publication date Apr 4, 2019
- Micron Technology, Inc.
- William R. Brown
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICES INCLUDING CONDUCTIVE LINES AND METHODS OF FOR...
- Publication number 20180114751
- Publication date Apr 26, 2018
- Micron Technology, Inc.
- William R. Brown
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICES INCLUDING CONDUCTIVE LINES AND METHODS OF FOR...
- Publication number 20170062324
- Publication date Mar 2, 2017
- Micron Technology, Inc.
- William R. Brown
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Methods Of Correcting For Variation Across Substrates During Photol...
- Publication number 20130288167
- Publication date Oct 31, 2013
- Micron Technology, Inc.
- Yuan He
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Raised-lines overlay semiconductor targets and method of making the...
- Publication number 20060017074
- Publication date Jan 26, 2006
- Pary Baluswamy
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Raised-lines overlay semiconductor targets and method of making the...
- Publication number 20050070069
- Publication date Mar 31, 2005
- Pary Baluswamy
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Layout for measurement of overlay error
- Publication number 20030027368
- Publication date Feb 6, 2003
- Pary Baluswamy
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Residue-free overlay target
- Publication number 20020036332
- Publication date Mar 28, 2002
- Pary Baluswamy
- H01 - BASIC ELECTRIC ELEMENTS

Tim H. Bossart

Person

Patents Grantslast 30 patents

Methods of forming semiconductor devices

Semiconductor devices including conductive lines and methods of for...

Semiconductor devices including conductive lines and methods of for...

Methods of correcting for variation across substrates during photol...

Residue free overlay target

Raised-lines overlay semiconductor targets and method of making the...

Layout for measurement of overlay error

Layout for measurement of overlay error

Method and apparatus for improved coating of a semiconductor wafer

Patents Applicationslast 30 patents

METHODS OF FORMING SEMICONDUCTOR DEVICES

SEMICONDUCTOR DEVICES INCLUDING CONDUCTIVE LINES AND METHODS OF FOR...

SEMICONDUCTOR DEVICES INCLUDING CONDUCTIVE LINES AND METHODS OF FOR...

Methods Of Correcting For Variation Across Substrates During Photol...

Raised-lines overlay semiconductor targets and method of making the...

Raised-lines overlay semiconductor targets and method of making the...

Layout for measurement of overlay error

Residue-free overlay target