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Tim V. Pham
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Austin, TX, US
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Patents Grants
last 30 patents
Information
Patent Grant
Defective die replacement in a die stack
Patent number
10,177,052
Issue date
Jan 8, 2019
NXP USA, INC.
Perry H. Pelley
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Die stack address bus having a programmable width
Patent number
10,002,653
Issue date
Jun 19, 2018
NXP USA, INC.
Perry H. Pelley
G11 - INFORMATION STORAGE
Information
Patent Grant
Matrix lid heatspreader for flip chip package
Patent number
9,640,469
Issue date
May 2, 2017
NXP USA, INC.
George R. Leal
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Thin low profile strip dual in-line memory module
Patent number
9,480,161
Issue date
Oct 25, 2016
FREESCALE SEMICONDUCTOR, INC.
Perry H. Pelley
G11 - INFORMATION STORAGE
Information
Patent Grant
Wirebond recess for stacked die
Patent number
9,318,451
Issue date
Apr 19, 2016
FREESCALE SEMICONDUCTOR, INC.
Tim V. Pham
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Package encapsulant relief feature
Patent number
9,281,256
Issue date
Mar 8, 2016
FREESCALE SEMICONDUCTOR, INC.
Min Ding
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Matrix lid heatspreader for flip chip package
Patent number
9,159,643
Issue date
Oct 13, 2015
FREESCALE SEMICONDUCTOR, INC.
George R. Leal
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Edge coupling of semiconductor dies
Patent number
9,087,702
Issue date
Jul 21, 2015
FREESCALE SEMICONDUCTOR, INC.
Tim V. Pham
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Heat conductive substrate for integrated circuit package
Patent number
9,070,657
Issue date
Jun 30, 2015
FREESCALE SEMICONDUCTOR, INC.
Tim V. Pham
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Methods and structures for reducing stress on die assembly
Patent number
8,970,026
Issue date
Mar 3, 2015
FREESCALE SEMICONDUCTOR, INC.
George R. Leal
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Using an integrated circuit die configuration for package height re...
Patent number
8,957,510
Issue date
Feb 17, 2015
FREESCALE SEMICONDUCTOR, INC.
Tim V. Pham
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Fluid cooled semiconductor die package
Patent number
8,860,212
Issue date
Oct 14, 2014
FREESCALE SEMICONDUCTOR, INC.
Chee Seng Foong
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Dynamic pad size to reduce solder fatigue
Patent number
8,008,786
Issue date
Aug 30, 2011
FREESCALE SEMICONDUCTOR, INC.
Tim V. Pham
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Dynamic pad size to reduce solder fatigue
Patent number
7,772,104
Issue date
Aug 10, 2010
FREESCALE SEMICONDUCTOR, INC.
Tim V. Pham
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Method for processing multiple semiconductor devices for test
Patent number
6,905,891
Issue date
Jun 14, 2005
Frrescale Semiconductor, Inc.
Gary J. Kovar
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
DIE STACK ADDRESS BUS HAVING A PROGRAMMABLE WIDTH
Publication number
20160118095
Publication date
Apr 28, 2016
FREESCALE SEMICONDUCTOR, INC.
Perry H. Pelley
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Matrix Lid Heatspreader for Flip Chip Package
Publication number
20160005682
Publication date
Jan 7, 2016
FREESCALE SEMICONDUCTOR, INC.
George R. Leal
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
DEFECTIVE DIE REPLACEMENT IN A DIE STACK
Publication number
20150287653
Publication date
Oct 8, 2015
FREESCALE SEMICONDUCTOR, INC.
Perry H. Pelley
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Thin Low Profile Strip Dual In-Line Memory Module
Publication number
20150208510
Publication date
Jul 23, 2015
FREESCALE SEMICONDUCTOR, INC.
Perry H. Pelley
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Application
WIREBOND RECESS FOR STACKED DIE
Publication number
20150115474
Publication date
Apr 30, 2015
TIM V. PHAM
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
HEAT CONDUCTIVE SUBSTRATE FOR INTEGRATED CIRCUIT PACKAGE
Publication number
20150097280
Publication date
Apr 9, 2015
Tim V. Pham
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
PACKAGE ENCAPSULANT RELIEF FEATURE
Publication number
20150084168
Publication date
Mar 26, 2015
MIN DING
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
RECESSED SEMICONDUCTOR DIE STACK
Publication number
20150069624
Publication date
Mar 12, 2015
FREESCALE SEMICONDUCTOR, INC.
Tim V. Pham
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
EDGE COUPLING OF SEMICONDUCTOR DIES
Publication number
20150061097
Publication date
Mar 5, 2015
FREESCALE SEMICONDUCTOR, INC.
Tim V. Pham
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
USING AN INTEGRATED CIRCUIT DIE CONFIGURATION FOR PACKAGE HEIGHT RE...
Publication number
20150008567
Publication date
Jan 8, 2015
TIM V. PHAM
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
FLUID COOLED SEMICONDUCTOR DIE PACKAGE
Publication number
20140306336
Publication date
Oct 16, 2014
Chee Seng Foong
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHODS AND STRUCTURES FOR REDUCING STRESS ON DIE ASSEMBLY
Publication number
20140225268
Publication date
Aug 14, 2014
GEORGE R. LEAL
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Matrix Lid Heatspreader for Flip Chip Package
Publication number
20140077352
Publication date
Mar 20, 2014
George R. Leal
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
DYNAMIC PAD SIZE TO REDUCE SOLDER FATIGUE
Publication number
20100264542
Publication date
Oct 21, 2010
Freescale Semiconductor Inc.
Tim V. Pham
Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information
Patent Application
Dynamic pad size to reduce solder fatigue
Publication number
20080185735
Publication date
Aug 7, 2008
Freescale Semiconductor, Inc.
Tim V. Pham
Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information
Patent Application
Method for processing multiple semiconductor devices for test
Publication number
20030160315
Publication date
Aug 28, 2003
Gary J. Kovar
G01 - MEASURING TESTING