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Timothy A. Johnson
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Tigard, OR, US
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Patents Grants
last 30 patents
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Patent Grant
Interferometric characterization of surface topography
Patent number
10,488,184
Issue date
Nov 26, 2019
Nanometrics Incorporated
Kevin Eduard Heidrich
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Via characterization for BCD and depth metrology
Patent number
10,254,110
Issue date
Apr 9, 2019
Nanometrics Incorporated
Ke Xiao
G01 - MEASURING TESTING
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Patent Grant
Local stress measurement
Patent number
8,534,135
Issue date
Sep 17, 2013
Nanometrics Incorporated
Timothy A Johnson
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
INTERFEROMETRIC CHARACTERIZATION OF SURFACE TOPOGRAPHY
Publication number
20170016715
Publication date
Jan 19, 2017
Nanometrics Incorporated
Kevin Eduard HEIDRICH
G01 - MEASURING TESTING
Information
Patent Application
VIA CHARACTERIZATION FOR BCD AND DEPTH METROLOGY
Publication number
20150168128
Publication date
Jun 18, 2015
Nanometrics Incorporated
Ke XIAO
G01 - MEASURING TESTING
Information
Patent Application
Local Stress Measurement
Publication number
20110265578
Publication date
Nov 3, 2011
Nanometrics Incorporated
Timothy A. Johnson
G01 - MEASURING TESTING