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Timothy Allen Barr
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Chandler, AZ, US
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last 30 patents
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Patent Grant
System for testing IC chips selectively with stored or internally g...
Patent number
6,415,409
Issue date
Jul 2, 2002
Unisys Corporation
James Vernon Rhodes
G01 - MEASURING TESTING
Information
Patent Grant
Program storage device containing instructions that are spaced apar...
Patent number
6,405,150
Issue date
Jun 11, 2002
Unisys Corporation
James Vernon Rhodes
G11 - INFORMATION STORAGE
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Patent Grant
Electronic system for testing a set of multiple chips concurrently...
Patent number
6,363,504
Issue date
Mar 26, 2002
Unisys Corporation
James Vernon Rhodes
G01 - MEASURING TESTING
Information
Patent Grant
Electronic system for testing chips having a selectable number of p...
Patent number
6,363,510
Issue date
Mar 26, 2002
Unisys Corporation
James Vernon Rhodes
G01 - MEASURING TESTING