New London, CT, US
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Patent Grant
The United States of America as represented by the Secretary of the Navy
Timothy B. Straw
G01 - MEASURING TESTING
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Patent Grant
The United States of America as represented by the Secretary of the Navy
Ahmed S. Zaki
G01 - MEASURING TESTING
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Patent Grant
The United States of America as represented by the Secretary of the Navy
Michael J. Obara
G01 - MEASURING TESTING
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Patent Grant
The United States of America as represented by the Secretary of the Navy
Timothy B. Straw
G01 - MEASURING TESTING
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Patent Grant
The United States of America as represented by the Secretary of the Navy
Thomas A. Freehill
G01 - MEASURING TESTING
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Patent Grant
The United States of America as represented by the Secretary of the Navy
Thomas A. Freehill
G01 - MEASURING TESTING
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Patent Grant
The United States of America as represented by the Secretary of the Navy
Timothy B. Straw
H03 - BASIC ELECTRONIC CIRCUITRY
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Patent Grant
The United States of America as represented by the Secretary of the Navy
Timothy B. Straw
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
The United States of America as represented by the Secretary of the Navy
Timothy B. Straw
H03 - BASIC ELECTRONIC CIRCUITRY
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Patent Grant
The United States of America as represented by the Secretary of the Navy
Mark B. Moffett
B06 - GENERATING OR TRANSMITTING MECHANICAL VIBRATIONS IN GENERAL
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Patent Grant
The United States of America as represented by the Secretary of the Navy
Timothy B. Straw
H04 - ELECTRIC COMMUNICATION TECHNIQUE
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Patent Grant
The United States of America as represented by the Secretary of the Navy
Philip G. Danforth
G01 - MEASURING TESTING
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Patent Application
Michael J. Obara
G01 - MEASURING TESTING
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Patent Application
Thomas A. Freehill
H03 - BASIC ELECTRONIC CIRCUITRY
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Patent Application
Thomas A. Freehill
G01 - MEASURING TESTING
