Timothy Burnett

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Manchester, GB

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Patents Grantslast 30 patents

Information Patent Grant
Contactless temperature measurement in a charged particle microscope
- Patent number 10,134,563
- Issue date Nov 20, 2018
- FEI Company
- Jacob Simon Faber
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
CONTACTLESS TEMPERATURE MEASUREMENT IN A CHARGED PARTICLE MICROSCOPE
- Publication number 20160133436
- Publication date May 12, 2016
- FEI Company
- Jacob Simon Faber
- G01 - MEASURING TESTING