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Timothy C. Milmore
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South Burlington, VT, US
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Patents Grants
last 30 patents
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Patent Grant
Overlay and CD process window structure
Patent number
7,538,344
Issue date
May 26, 2009
International Business Machines Corporation
Daniel J. Mellinger
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Multi-run selective pattern and etch wafer process
Patent number
7,060,626
Issue date
Jun 13, 2006
International Business Machines Corporation
Kenneth A. Bandy
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Overlay and CD process window structure
Patent number
6,967,709
Issue date
Nov 22, 2005
International Business Machines Corporation
Daniel J. Mellinger
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Method and system for determining overlay tolerance
Patent number
6,716,559
Issue date
Apr 6, 2004
International Business Machines Corporation
Robert K. Leidy
Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Patents Applications
last 30 patents
Information
Patent Application
Overlay and CD process window structure
Publication number
20050181288
Publication date
Aug 18, 2005
International Business Machines Corporation
Daniel J. Mellinger
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
OVERLAY AND CD PROCESS WINDOW STRUCTURE
Publication number
20050110969
Publication date
May 26, 2005
International Business Machines Corporation
Daniel J. Mellinger
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
MULTI-RUN SELECTIVE PATTERN AND ETCH WAFER PROCESS
Publication number
20040266202
Publication date
Dec 30, 2004
International Business Machines Corporation
Kenneth A. Bandy
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method and system for determining overlay tolerance
Publication number
20030113641
Publication date
Jun 19, 2003
International Business Machines Corporation
Robert K. Leidy
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY