Timothy D. Dorney

Person

Houston, TX, US

People

Patents Grantslast 30 patents

Information Patent Grant
Scanning optical delay line using a reflective element arranged to...
- Patent number 7,046,412
- Issue date May 16, 2006
- Timothy D. Dorney
- G01 - MEASURING TESTING
Information Patent Grant
Synchronous random access memory having column factor counter for b...
- Patent number 6,091,665
- Issue date Jul 18, 2000
- Texas Instruments Incorporated
- Timothy D. Dorney
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and device for testing a semiconductor serial access memory...
- Patent number 6,088,274
- Issue date Jul 11, 2000
- Texas Instruments Incorporated
- Timothy D. Dorney
- G11 - INFORMATION STORAGE
Information Patent Grant
Phased sense amplifiers
- Patent number 6,084,811
- Issue date Jul 4, 2000
- Texas Instruments Incorporated
- Timothy D. Dorney
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and apparatus for reducing area and pin count required in de...
- Patent number 5,920,573
- Issue date Jul 6, 1999
- Texas Istruments Incorporated
- Timothy D. Dorney
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and apparatus for a design for test, parallel block write op...
- Patent number 5,740,179
- Issue date Apr 14, 1998
- Texas Instruments Incorporated
- Timothy Dominic Dorney
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and system for reduced column redundancy using a dual column...
- Patent number 5,732,030
- Issue date Mar 24, 1998
- Texas Instruments Incorporated
- Timothy D. Dorney
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
Scanning optical delay line using a reflective element arranged to...
- Publication number 20040246550
- Publication date Dec 9, 2004
- Timothy D. Dorney
- G02 - OPTICS

Timothy D. Dorney

Person

Patents Grantslast 30 patents

Scanning optical delay line using a reflective element arranged to...

Synchronous random access memory having column factor counter for b...

Method and device for testing a semiconductor serial access memory...

Phased sense amplifiers

Method and apparatus for reducing area and pin count required in de...

Method and apparatus for a design for test, parallel block write op...

Method and system for reduced column redundancy using a dual column...

Patents Applicationslast 30 patents

Scanning optical delay line using a reflective element arranged to...