Timothy E. Cooper

Person

Discovery Bay, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Composite motion probing
- Patent number 7,868,632
- Issue date Jan 11, 2011
- FormFactor, Inc.
- Timothy E. Cooper
- G01 - MEASURING TESTING
Information Patent Grant
Probe card configuration for low mechanical flexural strength elect...
- Patent number 7,825,674
- Issue date Nov 2, 2010
- FormFactor, Inc.
- Makarand S. Shinde
- G01 - MEASURING TESTING
Information Patent Grant
Electronic device testing using a probe tip having multiple contact...
- Patent number 7,701,243
- Issue date Apr 20, 2010
- FormFactor, Inc.
- Timothy E. Cooper
- G01 - MEASURING TESTING
Information Patent Grant
Test method for yielding a known good die
- Patent number 7,694,246
- Issue date Apr 6, 2010
- FormFactor, Inc.
- Charles A. Miller
- G11 - INFORMATION STORAGE
Information Patent Grant
Apparatus and method for limiting over travel in a probe card assembly
- Patent number 7,482,822
- Issue date Jan 27, 2009
- FormFactor, Inc.
- Timothy E. Cooper
- G01 - MEASURING TESTING
Information Patent Grant
Methods of probing an electronic device
- Patent number 7,463,043
- Issue date Dec 9, 2008
- FormFactor, Inc.
- Timothy E. Cooper
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for probing an electronic device in which move...
- Patent number 7,218,127
- Issue date May 15, 2007
- FormFactor, Inc.
- Timothy E. Cooper
- G01 - MEASURING TESTING
Information Patent Grant
Composite motion probing
- Patent number 7,202,682
- Issue date Apr 10, 2007
- FormFactor, Inc.
- Timothy E. Cooper
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for limiting over travel in a probe card assembly
- Patent number 7,084,650
- Issue date Aug 1, 2006
- FormFactor, Inc.
- Timothy E. Cooper
- G01 - MEASURING TESTING
Information Patent Grant
Probe card configuration for low mechanical flexural strength elect...
- Patent number 7,071,715
- Issue date Jul 4, 2006
- FormFactor, Inc.
- Makarand S. Shinde
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
APPARATUS AND METHOD FOR LIMITING OVER TRAVEL IN A PROBE CARD ASSEMBLY
- Publication number 20090134897
- Publication date May 28, 2009
- FormFactor, Inc.
- Timothy E. Cooper
- G01 - MEASURING TESTING
Information Patent Application
PROBING A DEVICE
- Publication number 20090085592
- Publication date Apr 2, 2009
- FormFactor, Inc.
- Timothy E. Cooper
- G01 - MEASURING TESTING
Information Patent Application
PROBING A DEVICE
- Publication number 20070262767
- Publication date Nov 15, 2007
- FormFactor, Inc.
- Timothy E. Cooper
- G01 - MEASURING TESTING
Information Patent Application
Composite Motion Probing
- Publication number 20070170941
- Publication date Jul 26, 2007
- FormFactor, Inc.
- Timothy E. Cooper
- G01 - MEASURING TESTING
Information Patent Application
Apparatus And Method For Limiting Over Travel In A Probe Card Assembly
- Publication number 20060261827
- Publication date Nov 23, 2006
- FormFactor, Inc.
- Timothy E. Cooper
- G01 - MEASURING TESTING
Information Patent Application
Probe card configuration for low mechanical flexural strength elect...
- Publication number 20060244470
- Publication date Nov 2, 2006
- FormFactor, Inc.
- Makarand S. Shinde
- G01 - MEASURING TESTING
Information Patent Application
Probing a device
- Publication number 20050179455
- Publication date Aug 18, 2005
- FormFactor, Inc.
- Timothy E. Cooper
- G01 - MEASURING TESTING
Information Patent Application
Probe card configuration for low mechanical flexural strength elect...
- Publication number 20050156611
- Publication date Jul 21, 2005
- FormFactor, Inc.
- Makarand S. Shinde
- G01 - MEASURING TESTING
Information Patent Application
Composite motion probing
- Publication number 20040130312
- Publication date Jul 8, 2004
- FormFactor, Inc.
- Timothy E. Cooper
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for limiting over travel in a probe card assembly
- Publication number 20040113640
- Publication date Jun 17, 2004
- Timothy E. Cooper
- G01 - MEASURING TESTING
Information Patent Application
Test method for yielding a known good die
- Publication number 20030237061
- Publication date Dec 25, 2003
- FormFactor, Inc.
- Charles A. Miller
- G01 - MEASURING TESTING

Timothy E. Cooper

Person

Patents Grantslast 30 patents

Composite motion probing

Probe card configuration for low mechanical flexural strength elect...

Electronic device testing using a probe tip having multiple contact...

Test method for yielding a known good die

Apparatus and method for limiting over travel in a probe card assembly

Methods of probing an electronic device

Method and apparatus for probing an electronic device in which move...

Composite motion probing

Apparatus and method for limiting over travel in a probe card assembly

Probe card configuration for low mechanical flexural strength elect...

Patents Applicationslast 30 patents

APPARATUS AND METHOD FOR LIMITING OVER TRAVEL IN A PROBE CARD ASSEMBLY

PROBING A DEVICE

PROBING A DEVICE

Composite Motion Probing

Apparatus And Method For Limiting Over Travel In A Probe Card Assembly

Probe card configuration for low mechanical flexural strength elect...

Probing a device

Probe card configuration for low mechanical flexural strength elect...

Composite motion probing

Apparatus and method for limiting over travel in a probe card assembly

Test method for yielding a known good die