Timothy Goodwin

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Mountain View, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Apparatus and methods for measuring properties in a TSV structure u...
- Patent number 9,709,386
- Issue date Jul 18, 2017
- KLA-Tencor Corporation
- Lena Nicolaides
- G01 - MEASURING TESTING
Information Patent Grant
Automated inline inspection of wafer edge strain profiles using rap...
- Patent number 9,640,449
- Issue date May 2, 2017
- KLA-Tencor Corporation
- Timothy Goodwin
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Automated Inline Inspection of Wafer Edge Strain Profiles Using Rap...
- Publication number 20150371910
- Publication date Dec 24, 2015
- KLA-Tencor Corporation
- Timothy Goodwin
- G01 - MEASURING TESTING