Membership
Tour
Register
Log in
Timothy J. Warneck
Follow
Person
Hatfield, PA, US
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Method for operating an electronic module
Patent number
10,215,832
Issue date
Feb 26, 2019
Semiconductor Components Industries, LLC
Timothy J. Warneck
G01 - MEASURING TESTING
Information
Patent Grant
Electronic device with flexible data and power interface
Patent number
9,921,288
Issue date
Mar 20, 2018
Semiconductor Components Industries, LLC
Timothy J. Warneck
G01 - MEASURING TESTING
Information
Patent Grant
Electronic device with flexible data and power interface
Patent number
9,329,063
Issue date
May 3, 2016
Semiconductor Components Industries, LLC
Timothy J. Warneck
G01 - MEASURING TESTING
Information
Patent Grant
Sensor device and sensor interface
Patent number
8,878,518
Issue date
Nov 4, 2014
Panasonic Corporation
Masahisa Niwa
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
METHOD FOR OPERATING AN ELECTRONIC MODULE
Publication number
20180188345
Publication date
Jul 5, 2018
Semiconductor Components Industries, LLC
Timothy J. Warneck
G01 - MEASURING TESTING
Information
Patent Application
ELECTRONIC DEVICE WITH FLEXIBLE DATA AND POWER INTERFACE
Publication number
20160238687
Publication date
Aug 18, 2016
Semiconductor Components Industries, LLC
Timothy J. Warneck
G01 - MEASURING TESTING
Information
Patent Application
SENSOR DEVICE AND SENSOR INTERFACE
Publication number
20140035558
Publication date
Feb 6, 2014
PANASONIC CORPORATION
Masahisa NIWA
G01 - MEASURING TESTING
Information
Patent Application
ELECTRONIC DEVICE WITH FLEXIBLE DATA AND POWER INTERFACE
Publication number
20120198908
Publication date
Aug 9, 2012
Semiconductor Components Industries, LLC
Timothy J. WARNECK
G01 - MEASURING TESTING