Timothy L. Brown

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Vancouver, WA, US

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Patents Grantslast 30 patents

Information Patent Grant
Methods and apparatus for predicting oxygen-induced stacking fault...
- Patent number 6,798,526
- Issue date Sep 28, 2004
- SEH America, Inc.
- Timothy L. Brown
- G01 - MEASURING TESTING
Information Patent Grant
Double side polished wafers having external gettering sites, and me...
- Patent number 6,576,501
- Issue date Jun 10, 2003
- SEH America, Inc.
- David A. Beauchaine
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for measurement of OSF density
- Patent number 6,275,293
- Issue date Aug 14, 2001
- SEH America, Inc.
- Timothy L. Brown
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Methods and apparatus for predicting oxygen-induced stacking fault...
- Publication number 20040051882
- Publication date Mar 18, 2004
- Timothy L. Brown
- G01 - MEASURING TESTING
Information Patent Application
Double side polished wafers having external gettering sites, and me...
- Publication number 20030224603
- Publication date Dec 4, 2003
- David A. Beauchaine
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Double side polished wafers having external gettering sites, and me...
- Publication number 20030224135
- Publication date Dec 4, 2003
- David A. Beauchaine
- H01 - BASIC ELECTRIC ELEMENTS