Timothy L. Kraynak

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Hatboro, PA, US

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Patents Grantslast 30 patents

Information Patent Grant
Compressive conductors for semiconductor testing
- Patent number 7,728,611
- Issue date Jun 1, 2010
- Interconnect Devices, Inc.
- Timothy L. Kraynak
- G01 - MEASURING TESTING
Information Patent Grant
Crimped tube electrical test socket pin
- Patent number 7,297,004
- Issue date Nov 20, 2007
- Antares Advanced Test Technologies, Inc.
- John M. Shuhart
- H01 - BASIC ELECTRIC ELEMENTS