Timothy McMullen

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Lino Lakes, MN, US

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Patents Grantslast 30 patents

Information Patent Grant
Systems and methods for electrically testing electromigration in an...
- Patent number 10,161,994
- Issue date Dec 25, 2018
- FormFactor Beaverton, Inc.
- Timothy Allen McMullen
- G01 - MEASURING TESTING
Information Patent Grant
Probe systems, storage media, and methods for wafer-level testing o...
- Patent number 10,060,963
- Issue date Aug 28, 2018
- FormFactor Beaverton, Inc.
- Timothy Allen McMullen
- G01 - MEASURING TESTING
Information Patent Grant
Modular, semiconductor reliability test system
- Patent number 6,097,200
- Issue date Aug 1, 2000
- Aetrium Incorporated
- Venu Turlapaty
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEMS AND METHODS FOR ELECTRICALLY TESTING ELECTROMIGRATION IN AN...
- Publication number 20170356957
- Publication date Dec 14, 2017
- Cascade Microtech, Inc.
- Timothy Allen McMullen
- G01 - MEASURING TESTING
Information Patent Application
PROBE SYSTEMS, STORAGE MEDIA, AND METHODS FOR WAFER-LEVEL TESTING O...
- Publication number 20170285083
- Publication date Oct 5, 2017
- Cascade Microtech, Inc.
- Timothy Allen McMullen
- G01 - MEASURING TESTING