Timothy R. Tiemeyer

Person

Randolph, MA, US

People

Patents Grantslast 30 patents

Information Patent Grant
System with multiple scattered light collectors
- Patent number 9,103,800
- Issue date Aug 11, 2015
- KLA-Tencor Corporation
- Richard E. Bills
- G01 - MEASURING TESTING
Information Patent Grant
System and method for inspection of a workpiece surface using multi...
- Patent number 8,497,984
- Issue date Jul 30, 2013
- KLA-Tencor Corporation
- Richard Earl Bills
- G01 - MEASURING TESTING
Information Patent Grant
Threshold determination in an inspection system
- Patent number 8,260,035
- Issue date Sep 4, 2012
- KLA-Tencor Corporation
- Mehmet Tek
- G01 - MEASURING TESTING
Information Patent Grant
System and method for signal processing for a workpiece surface ins...
- Patent number 7,505,125
- Issue date Mar 17, 2009
- KLA-Tencor Corporation
- Scott Andrews
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for inspecting a workpiece surface using surface...
- Patent number 7,286,218
- Issue date Oct 23, 2007
- KLA-Tencor Technologies Corporation
- Timothy R. Tiemeyer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Detection of a wafer edge using collimated light
- Patent number 7,280,200
- Issue date Oct 9, 2007
- ADE Corporation
- Mark P. Plemmons
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
System With Multiple Scattered Light Collectors
- Publication number 20130335733
- Publication date Dec 19, 2013
- KLA-Tencor Corporation
- Richard E. Bills
- G01 - MEASURING TESTING
Information Patent Application
System and method for detecting surface features on a semiconductor...
- Publication number 20090073440
- Publication date Mar 19, 2009
- Timothy Tiemeyer
- G01 - MEASURING TESTING
Information Patent Application
System and method for defect detection threshold determination in a...
- Publication number 20080075353
- Publication date Mar 27, 2008
- Mehmet Tek
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
System and method for inspection of a workpiece surface using multi...
- Publication number 20060256326
- Publication date Nov 16, 2006
- Richard Earl Bills
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
System and method for inspecting a workpiece surface using combinat...
- Publication number 20060192950
- Publication date Aug 31, 2006
- Neil Judell
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
System and method for signal processing for a workpiece surface ins...
- Publication number 20060181700
- Publication date Aug 17, 2006
- Scott Andrews
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Detection of a wafer edge using collimated light
- Publication number 20050024632
- Publication date Feb 3, 2005
- Mark P. Plemmons
- G01 - MEASURING TESTING
Information Patent Application
Method and system for classifying defects occurring at a surface of...
- Publication number 20040258295
- Publication date Dec 23, 2004
- ADE CORPORATION
- Timothy R. Tiemeyer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and system for analyzing and tracking defects among a plural...
- Publication number 20040252879
- Publication date Dec 16, 2004
- ADE CORPORATION
- Timothy R. Tiemeyer
- G06 - COMPUTING CALCULATING COUNTING

Timothy R. Tiemeyer

Person

Patents Grantslast 30 patents

System with multiple scattered light collectors

System and method for inspection of a workpiece surface using multi...

Threshold determination in an inspection system

System and method for signal processing for a workpiece surface ins...

System and method for inspecting a workpiece surface using surface...

Detection of a wafer edge using collimated light

Patents Applicationslast 30 patents

System With Multiple Scattered Light Collectors

System and method for detecting surface features on a semiconductor...

System and method for defect detection threshold determination in a...

System and method for inspection of a workpiece surface using multi...

System and method for inspecting a workpiece surface using combinat...

System and method for signal processing for a workpiece surface ins...

Detection of a wafer edge using collimated light

Method and system for classifying defects occurring at a surface of...

Method and system for analyzing and tracking defects among a plural...