Timothy S. Hayes

Person

Milton, VT, US

People

Patents Grantslast 30 patents

Information Patent Grant
System and method for forming an aluminum fuse for compatibility wi...
- Patent number 8,927,411
- Issue date Jan 6, 2015
- International Business Machines Corporation
- Felix P. Anderson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for forming aluminum fuse for compatibility with...
- Patent number 8,921,975
- Issue date Dec 30, 2014
- International Business Machines Corporation
- Felix P. Anderson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for quantifying the step profile characteristics...
- Patent number 6,980,937
- Issue date Dec 27, 2005
- International Business Machines Corporation
- Timothy S. Hayes
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methodology for measuring and controlling film thickness profiles
- Patent number 6,864,189
- Issue date Mar 8, 2005
- International Business Machines Corporation
- Timothy S. Hayes
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Incorporation of an impurity into a thin film
- Patent number 6,774,019
- Issue date Aug 10, 2004
- International Business Machines Corporation
- Charles Augustus Choate
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Method and system for measuring characteristics of curved features
- Patent number 6,724,947
- Issue date Apr 20, 2004
- International Business Machines Corporation
- Timothy S. Hayes
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM AND METHOD FOR FORMING AN ALUMINUM FUSE FOR COMPATIBILITY WI...
- Publication number 20140106559
- Publication date Apr 17, 2014
- International Business Machines Corporation
- Felix P. Anderson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AND METHOD FOR FORMING ALUMINUM FUSE FOR COMPATIBILITY WITH...
- Publication number 20130320488
- Publication date Dec 5, 2013
- International Business Machines Corporation
- Felix P. Anderson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS FOR SINGULATING INTEGRATED CIRCUIT CHIPS
- Publication number 20090155981
- Publication date Jun 18, 2009
- Stephen P. Ayotte
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODOLOGY FOR MEASURING AND CONTROLLING FILM THICKNESS PROFILES
- Publication number 20040266035
- Publication date Dec 30, 2004
- International Business Machines Corporation
- Timothy S Hayes
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Incorporation of an impurity into a thin film
- Publication number 20040144313
- Publication date Jul 29, 2004
- International Business Machines Corporation
- Charles Augustus Choate
- C30 - CRYSTAL GROWTH
Information Patent Application
Incorporation of an impurity into a thin film
- Publication number 20030213433
- Publication date Nov 20, 2003
- International Business Machines Corporation
- Charles Augustus Choate
- C30 - CRYSTAL GROWTH
Information Patent Application
Method and system for quantifying the step profile characteristics...
- Publication number 20030108235
- Publication date Jun 12, 2003
- International Business Machines Corporation
- Timothy S. Hayes
- G06 - COMPUTING CALCULATING COUNTING

Timothy S. Hayes

Person

Patents Grantslast 30 patents

System and method for forming an aluminum fuse for compatibility wi...

System and method for forming aluminum fuse for compatibility with...

Method and system for quantifying the step profile characteristics...

Methodology for measuring and controlling film thickness profiles

Incorporation of an impurity into a thin film

Method and system for measuring characteristics of curved features

Patents Applicationslast 30 patents

SYSTEM AND METHOD FOR FORMING AN ALUMINUM FUSE FOR COMPATIBILITY WI...

SYSTEM AND METHOD FOR FORMING ALUMINUM FUSE FOR COMPATIBILITY WITH...

METHOD AND APPARATUS FOR SINGULATING INTEGRATED CIRCUIT CHIPS

METHODOLOGY FOR MEASURING AND CONTROLLING FILM THICKNESS PROFILES

Incorporation of an impurity into a thin film

Incorporation of an impurity into a thin film

Method and system for quantifying the step profile characteristics...