Timwah Luk

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Scarborough, ME, US

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Patents Grantslast 30 patents

Information Patent Grant
Isolation between semiconductor components
- Patent number 10,446,498
- Issue date Oct 15, 2019
- FAIRCHILD SEMICONDUCTOR CORPORATION
- John Constantino
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Isolation between semiconductor components
- Patent number 9,735,112
- Issue date Aug 15, 2017
- Fairchild Semiconductor Corporation
- John Constantino
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Die scale strain gauge
- Patent number 7,934,430
- Issue date May 3, 2011
- Fairchild Semiconductor Corporation
- Scott Irving
- G01 - MEASURING TESTING
Information Patent Grant
Retrograde NWell cathode Schottky transistor and fabrication process
- Patent number 5,536,966
- Issue date Jul 16, 1996
- National Semiconductor Corporation
- Murray J. Robinson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Temperature compensated bipolar circuits
- Patent number 4,853,646
- Issue date Aug 1, 1989
- Fairchild Semiconductor Corporation
- Terry J. Johnson
- H03 - BASIC ELECTRONIC CIRCUITRY

Patents Applicationslast 30 patents

Information Patent Application
ISOLATION BETWEEN SEMICONDUCTOR COMPONENTS
- Publication number 20170373008
- Publication date Dec 28, 2017
- FAIRCHILD SEMICONDUCTOR CORPORATION
- John CONSTANTINO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ISOLATION BETWEEN SEMICONDUCTOR COMPONENTS
- Publication number 20150200162
- Publication date Jul 16, 2015
- Fairchild Semiconductor Corporation
- John CONSTANTINO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PACKAGE INCLUDING ORIENTED DEVICES
- Publication number 20090140266
- Publication date Jun 4, 2009
- Yong Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DIE SCALE STRAIN GAUGE
- Publication number 20090114030
- Publication date May 7, 2009
- Scott Irving
- G01 - MEASURING TESTING