Tina M. Dewar

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Dayton, OH, US

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Patents Grantslast 30 patents

Information Patent Grant
Robust detection of strain with temperature correction
- Patent number 7,362,096
- Issue date Apr 22, 2008
- Delphi Technologies, Inc.
- Larry M. Oberdier
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Robust detection of strain with temperature correction
- Publication number 20070096724
- Publication date May 3, 2007
- Larry M. Oberdier
- G01 - MEASURING TESTING