Ting Hu

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Monrovia, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Fine pitch probes for semiconductor testing, and a method to fabric...
- Patent number 9,194,887
- Issue date Nov 24, 2015
- Advantest America, Inc
- Florent Cros
- G01 - MEASURING TESTING
Information Patent Grant
Fine pitch probes for semiconductor testing, and a method to fabric...
- Patent number 9,000,793
- Issue date Apr 7, 2015
- Advantest America, Inc
- Florent Cros
- G01 - MEASURING TESTING
Information Patent Grant
Probe for testing semiconductor devices
- Patent number 8,344,748
- Issue date Jan 1, 2013
- Advantest America, Inc
- Melvin Khoo
- G01 - MEASURING TESTING
Information Patent Grant
Probe for testing semiconductor devices with features that increase...
- Patent number 7,772,859
- Issue date Aug 10, 2010
- Touchdown Technologies, Inc.
- Melvin Khoo
- G01 - MEASURING TESTING
Information Patent Grant
Hybrid probe for testing semiconductor devices
- Patent number 7,589,542
- Issue date Sep 15, 2009
- Touchdown Technologies Inc.
- Melvin Khoo
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
FINE PITCH PROBES FOR SEMICONDUCTOR TESTING, AND A METHOD TO FABRIC...
- Publication number 20140132298
- Publication date May 15, 2014
- ADVANTEST AMERICA, INC.
- Florent Cros
- G01 - MEASURING TESTING
Information Patent Application
FINE PITCH PROBES FOR SEMICONDUCTOR TESTING, AND A METHOD TO FABRIC...
- Publication number 20140132300
- Publication date May 15, 2014
- ADVANTEST AMERICA, INC.
- Florent Cros
- G01 - MEASURING TESTING
Information Patent Application
PROBE FOR TESTING SEMICONDUCTOR DEVICES
- Publication number 20120032697
- Publication date Feb 9, 2012
- TOUCHDOWN TECHNOLOGIES, INC.
- Melvin Khoo
- G01 - MEASURING TESTING
Information Patent Application
PROBE FOR TESTING SEMICONDUCTOR DEVICES
- Publication number 20080252328
- Publication date Oct 16, 2008
- TOUCHDOWN TECHNOLOGIES, INC.
- Zhiyong An
- G01 - MEASURING TESTING